• 8097 Citations
  • 43 h-Index
1965 …2018

Research output per year

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Research Output

2018

Elevated temperature dependence of the anisotropic visible-to-ultraviolet dielectric function of monoclinic β -Ga2O3

Mock, A., Vanderslice, J., Korlacki, R., Woollam, J. A. & Schubert, M., Jan 22 2018, In : Applied Physics Letters. 112, 4, 041905.

Research output: Contribution to journalArticle

5 Scopus citations
2017
2 Scopus citations

Screening effects in metal sculptured thin films studied with terahertz Mueller matrix ellipsometry

Hofmann, T., Knight, S., Sekora, D., Schmidt, D., Herzinger, C. M., Woollam, J. A., Schubert, E. & Schubert, M., Nov 1 2017, In : Applied Surface Science. 421, p. 513-517 5 p.

Research output: Contribution to journalArticle

4 Scopus citations
2014

Invited Article: An integrated mid-infrared, far-infrared, and terahertz optical Hall effect instrument

Kühne, P., Herzinger, C. M., Schubert, M., Woollam, J. A. & Hofmann, T., Jul 2014, In : Review of Scientific Instruments. 85, 7, 071301.

Research output: Contribution to journalArticle

25 Scopus citations
2013

Polarization selection rules for inter-landau-level transitions in epitaxial graphene revealed by the infrared optical hall effect

Kühne, P., Darakchieva, V., Yakimova, R., Tedesco, J. D., Myers-Ward, R. L., Eddy, C. R., Gaskill, D. K., Herzinger, C. M., Woollam, J. A., Schubert, M. & Hofmann, T., Aug 14 2013, In : Physical Review Letters. 111, 7, 077402.

Research output: Contribution to journalArticle

15 Scopus citations
2012

Temperature dependent effective mass in AlGaN/GaN high electron mobility transistor structures

Hofmann, T., Kühne, P., Schöche, S., Chen, J. T., Forsberg, U., Janzén, E., Ben Sedrine, N., Herzinger, C. M., Woollam, J. A., Schubert, M. & Darakchieva, V., Nov 5 2012, In : Applied Physics Letters. 101, 19, 192102.

Research output: Contribution to journalArticle

24 Scopus citations
2011

Hole-channel conductivity in epitaxial graphene determined by terahertz optical-Hall effect and midinfrared ellipsometry

Hofmann, T., Boosalis, A., Kühne, P., Herzinger, C. M., Woollam, J. A., Gaskill, D. K., Tedesco, J. L. & Schubert, M., Jan 24 2011, In : Applied Physics Letters. 98, 4, 041906.

Research output: Contribution to journalArticle

36 Scopus citations

Metal slanted columnar thin film THz optical sensors

Hofmann, T., Schmidt, D., Boosalis, A., Kühne, P., Herzinger, C. M., Woollam, J. A., Schubert, E. & Schubert, M., 2011, Functional Semiconductor Nanocrystals and Metal-Hybrid Structures. p. 1-6 6 p. (Materials Research Society Symposium Proceedings; vol. 1409).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Terahertz ellipsometry and terahertz optical-Hall effect

Hofmann, T., Herzinger, C. M., Tedesco, J. L., Gaskill, D. K., Woollam, J. A. & Schubert, M., Feb 28 2011, In : Thin Solid Films. 519, 9, p. 2593-2600 8 p.

Research output: Contribution to journalArticle

34 Scopus citations

Terahertz optical-Hall effect characterization of two-dimensional electron gas properties in AlGaN/GaN high electron mobility transistor structures

Schöche, S., Shi, J., Boosalis, A., Kühne, P., Herzinger, C. M., Woollam, J. A., Schaff, W. J., Eastman, L. F., Schubert, M. & Hofmann, T., Feb 28 2011, In : Applied Physics Letters. 98, 9, 092103.

Research output: Contribution to journalArticle

18 Scopus citations

THz dielectric anisotropy of metal slanted columnar thin films

Hofmann, T., Schmidt, D., Boosalis, A., Khne, P., Skomski, R., Herzinger, C. M., Woollam, J. A., Schubert, M. & Schubert, E., Aug 22 2011, In : Applied Physics Letters. 99, 8, 081903.

Research output: Contribution to journalArticle

29 Scopus citations
2010

Spectroscopic ellipsometry characterization of SiNx antireflection films on textured multicrystalline and monocrystalline silicon solar cells

Saenger, M. F., Sun, J., Schädel, M., Hilfiker, J., Schubert, M. & Woollam, J. A., Jan 31 2010, In : Thin Solid Films. 518, 7, p. 1830-1834 5 p.

Research output: Contribution to journalArticle

20 Scopus citations

Variable-wavelength frequency-domain terahertz ellipsometry

Hofmann, T., Herzinger, C. M., Boosalis, A., Tiwald, T. E., Woollam, J. A. & Schubert, M., 2010, In : Review of Scientific Instruments. 81, 2, 023101.

Research output: Contribution to journalArticle

59 Scopus citations
2009

Characterizing antireflection coatings on textured mono-crystalline silicon with spectroscopic ellipsometry

Sun, J., Saenger, M. F., Schubert, M., Hilfiker, J. N., Synowicki, R., Herzinger, C. M. & Woollam, J. A., 2009, 2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009. p. 1407-1411 5 p. 5411301. (Conference Record of the IEEE Photovoltaic Specialists Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Hole diffusion profile in a p- p+ silicon homojunction determined by terahertz and midinfrared spectroscopic ellipsometry

Hofmann, T., Herzinger, C. M., Tiwald, T. E., Woollam, J. A. & Schubert, M., 2009, In : Applied Physics Letters. 95, 3, 032102.

Research output: Contribution to journalArticle

18 Scopus citations

Infrared ellipsometric characterization of silicon nitride films on textured Si photovoltaic cells

Saenger, M. F., Schädel, M., Hofmann, T., Hilfiker, J., Sun, J., Tiwald, T., Schubert, M. & Woollam, J. A., 2009, Materials Research Society Symposium Proceedings - Photovoltaic Materials and Manufacturing Issues. p. 145-150 6 p. (Materials Research Society Symposium Proceedings; vol. 1123).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Materials characterization using THz ellipsometry

Hofmann, T., Herzinger, C. M., Woollam, J. A. & Schubert, M., 2009, Materials Research for Terahertz Technology Development. Materials Research Society, p. 19-24 6 p. (Materials Research Society Symposium Proceedings; vol. 1163).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Terahertz ellipsometry using electron-beam based sources

Hofmann, T., Herzinger, C. M., Schade, U., Mross, M., Woollam, J. A. & Schubert, M., 2009, Materials Research Society Symposium Proceedings - Performance and Reliability of Semiconductor Devices. p. 85-90 6 p. (Materials Research Society Symposium Proceedings; vol. 1108).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations
2008
7 Scopus citations

Effects of ion concentration on refractive indices of fluids measured by the minimum deviation technique

Berlind, T., Pribil, G. K., Thompson, D., Woollam, J. A. & Arwin, H., 2008, In : Physica Status Solidi (C) Current Topics in Solid State Physics. 5, 5, p. 1249-1252 4 p.

Research output: Contribution to journalConference article

18 Scopus citations

Infrared ellipsometry studies of thermal stability of protein monolayers and multilayers

Arwin, H., Askendahl, A., Tengvall, P., Thompson, D. W. & Woollam, J. A., 2008, In : Physica Status Solidi (C) Current Topics in Solid State Physics. 5, 5, p. 1438-1441 4 p.

Research output: Contribution to journalConference article

10 Scopus citations

Monitoring organic thin film growth in aqueous solution in-situ with a combined Quartz Crystal Microbalance and ellipsometry

Sarkar, A., Viitala, T., Hofrnann, T., Tiwald, T. E., Woollam, J. A., Kjerstad, A., Laderian, B. & Schubert, M., 2008, In-Situ Studies Across Spatial and Temporal Scales for Nanoscience and Technology. p. 53-59 7 p. (Materials Research Society Symposium Proceedings; vol. 1146).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2007

Repeatability of ellipsometric data in cholera toxin GM1-ELISA structures

Castro, L. G., Thompson, D. W., Tiwald, T., Berberov, E. M. & Woollam, J. A., Apr 15 2007, In : Surface Science. 601, 8, p. 1795-1803 9 p.

Research output: Contribution to journalArticle

6 Scopus citations

Vacuum ultraviolet optical analysis of spin-cast chitosan films modified by succinic anhydride and glycidyl phenyl ether

Nosal, W. H., Thompson, D. W., Tiwald, T. E., Sarkar, S., Subramanian, A. & Woollam, J. A., Sep 2007, In : Surface and Interface Analysis. 39, 9, p. 747-751 5 p.

Research output: Contribution to journalArticle

2 Scopus citations
2006

Physical and chemical properties of sputter-deposited TaCxN y films

Aouadi, S. M., Zhang, Y., Basnyat, P., Stadler, S., Filip, P., Williams, M., Hilfiker, J. N., Singh, N. & Woollam, J. A., Feb 15 2006, In : Journal of Physics Condensed Matter. 18, 6, p. 1977-1986 10 p.

Research output: Contribution to journalArticle

13 Scopus citations

Vacuum ultra-violet spectroscopic ellipsometry study of single-and multi-phase nitride protective films

Aouadi, S. M., Bohnhoff, A., Amriou, T., Williams, M., Hilfiker, J. N., Singh, N. & Woollam, J. A., Aug 16 2006, In : Journal of Physics Condensed Matter. 18, 32, p. S1691-S1701 S01.

Research output: Contribution to journalArticle

9 Scopus citations
2005

A new figure of merit for solar selective surfaces

Woods, B. W., Thompson, D. W. & Woollam, J. A., 2005, In : Proceedings, Annual Technical Conference - Society of Vacuum Coaters. p. 341-344 4 p.

Research output: Contribution to journalConference article

Carbonic anhydrase adsorption in porous silicon studied with infrared ellipsometry

Arwin, H., Karlsson, L. M., Kozarcanin, A., Thompson, D. W., Tiwald, T. & Woollam, J. A., Jun 2005, In : Physica Status Solidi (A) Applications and Materials Science. 202, 8, p. 1688-1692 5 p.

Research output: Contribution to journalArticle

3 Scopus citations

Enhancing infrared response of adsorbed biomaterials using ellipsometry and textured surfaces

Thompson, D. W. & Woollam, J. A., 2005, In : Spectroscopy. 19, 3, p. 147-164 18 p.

Research output: Contribution to journalArticle

Open Access
2 Scopus citations

Infrared optical properties and AFM of spin-cast chitosan films chemically modified with 1,2 Epoxy-3-phenoxy-propane

Nosal, W. H., Thompson, D. W., Yan, L., Sarkar, S., Subramanian, A. & Woollam, J. A., Nov 25 2005, In : Colloids and Surfaces B: Biointerfaces. 46, 1, p. 26-31 6 p.

Research output: Contribution to journalArticle

10 Scopus citations

Optical characterization of porous alumina from vacuum ultraviolet to midinfrared

Thompson, D. W., Snyder, P. G., Castro, L., Yan, L., Kaipa, P. & Woollam, J. A., 2005, In : Journal of Applied Physics. 97, 11, 113511.

Research output: Contribution to journalArticle

37 Scopus citations

Quantitative oscillator analysis of IR-optical spectra on spin-cast chitosan films

Nosal, W. H., Thompson, D. W., Sarkar, S., Subramanian, A. & Woollam, J. A., 2005, In : Spectroscopy. 19, 5-6, p. 267-274 8 p.

Research output: Contribution to journalArticle

Open Access
1 Scopus citations

UV-vis-infrared optical and AFM study of spin-cast chitosan films

Nosal, W. H., Thompson, D. W., Yan, L., Sarkar, S., Subramanian, A. & Woollam, J. A., Jul 10 2005, In : Colloids and Surfaces B: Biointerfaces. 43, 3-4, p. 131-137 7 p.

Research output: Contribution to journalArticle

27 Scopus citations
2004

Gold-alumina cermet photothermal films

Woods, B. W., Thompson, D. W. & Woollam, J. A., Dec 22 2004, In : Thin Solid Films. 469-470, SPEC. ISS., p. 31-37 7 p.

Research output: Contribution to journalArticle

6 Scopus citations

Instrumentation: Ellipsometry

Hilfiker, J. N. & Woollam, J. A., Jan 1 2004, Encyclopedia of Modern Optics, Five-Volume Set. Elsevier Inc., p. 297-307 11 p.

Research output: Chapter in Book/Report/Conference proceedingChapter

3 Scopus citations

Synthesis and characterization of albumin binding surfaces for implantable surfaces

Subramanian, A., Sarkar, S., Woollam, J. A. & Nosal, W. H., 2004, In : Biomedical Sciences Instrumentation. 40, p. 1-6 6 p.

Research output: Contribution to journalArticle

8 Scopus citations
2003

Application of spectroscopic ellipsometry to characterization of optical thin films

Woollam, J. A., Bungay, C., Yan, L., Thompson, D. W. & Hilfiker, J., 2003, In : Proceedings of SPIE - The International Society for Optical Engineering. 4932, p. 393-404 12 p.

Research output: Contribution to journalConference article

9 Scopus citations

Cermet film space optical coatings

Woods, B. W., Thompson, D. W. & Woollam, J. A., 2003, In : European Space Agency, (Special Publication) ESA SP. 540, p. 445-450 6 p.

Research output: Contribution to journalConference article

Infrared and visible ellipsometric studies of cholera toxin in ELISA structures

Thompson, D. W., Pfeiffer, G., Berberov, E., Castro, L. & Woollam, J. A., 2003, In : Proceedings of SPIE - The International Society for Optical Engineering. 4965, p. 138-146 9 p.

Research output: Contribution to journalConference article

1 Scopus citations

Iridium substrates for space contamination studies: Erosion rates under atomic oxygen exposure

Yan, L. & Woollam, J. A., 2003, In : European Space Agency, (Special Publication) ESA SP. 540, p. 509-513 5 p.

Research output: Contribution to journalConference article

Progress in spectroscopic ellipsometry: Applications from vacuum ultraviolet to infrared

Hilfiker, J. N., Bungay, C. L., Synowicki, R. A., Tiwald, T. E., Herzinger, C. M., Johs, B., Pribil, G. K. & Woollam, J. A., Jul 2003, In : Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films. 21, 4, p. 1103-1108 6 p.

Research output: Contribution to journalArticle

51 Scopus citations

Recent Developments in Spectroscopic Ellipsometry for Materials and Process Control

Hilfiker, J. N., Johs, B., Hale, J., Herzinger, C. M., Tiwald, T. E., Bungay, C. L., Synowicki, R. A., Pribil, G. K. & Woollam, J. A., 2003, In : Proceedings, Annual Technical Conference - Society of Vacuum Coaters. p. 365-370 6 p.

Research output: Contribution to journalConference article

1 Scopus citations

VUV and IR spectroellipsometric studies of polymer surfaces

Woollam, J. A., Bungay, C., Hilfiker, J. & Tiwald, T., Aug 2003, In : Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms. 208, 1-4, p. 35-39 5 p.

Research output: Contribution to journalConference article

13 Scopus citations
2002

Low-orbit-environment protective coating for all-solid-state electrochromic surface heat radiation control devices

Franke, E., Neumann, H., Schubert, M., Trimble, C. L., Yan, L. & Woollam, J. A., Mar 1 2002, In : Surface and Coatings Technology. 151-152, p. 285-288 4 p.

Research output: Contribution to journalArticle

27 Scopus citations

Optical constants and roughness study of dc magnetron sputtered iridium films

Yan, L. & Woollam, J. A., Oct 15 2002, In : Journal of Applied Physics. 92, 8, p. 4386-4392 7 p.

Research output: Contribution to journalArticle

27 Scopus citations

Oxygen plasma effects on optical properties of ZnSe films

Yan, L., Woollam, J. A. & Franke, E., May 2002, In : Journal of Vacuum Science and Technology, Part A: Vacuum, Surfaces and Films. 20, 3, p. 693-701 9 p.

Research output: Contribution to journalArticle

18 Scopus citations
2001

Giant photoresistivity and optically controlled switching in self-assembled nanowires

Kouklin, N., Menon, L., Wong, A. Z., Thompson, D. W., Woollam, J. A., Williams, P. F. & Bandyopadhyay, S., Dec 24 2001, In : Applied Physics Letters. 79, 26, p. 4423-4425 3 p.

Research output: Contribution to journalArticle

117 Scopus citations

Infrared ellipsometry - A novel tool for characterization of group-III nitride heterostructures for optoelectronic device applications

Schubert, M., Kasic, A., Einfeldt, S., Hommel, D., Köhler, U., As, D. J., Off, J., Kuhn, B., Scholz, F. & Woollam, J. A., Nov 2001, In : Physica Status Solidi (B) Basic Research. 228, 2, p. 437-440 4 p.

Research output: Contribution to journalArticle

13 Scopus citations

Infrared ellipsometry characterization of porous silicon Bragg reflectors

Zangooie, S., Zangooie, S., Schubert, M., Trimble, C., Thompson, D. W. & Woollam, J. A., Feb 20 2001, In : Applied optics. 40, 6, p. 906-912 7 p.

Research output: Contribution to journalArticle

22 Scopus citations