• 8097 Citations
  • 43 h-Index
1965 …2018

Research output per year

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Research Output

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Conference contribution
2011

Metal slanted columnar thin film THz optical sensors

Hofmann, T., Schmidt, D., Boosalis, A., Kühne, P., Herzinger, C. M., Woollam, J. A., Schubert, E. & Schubert, M., 2011, Functional Semiconductor Nanocrystals and Metal-Hybrid Structures. p. 1-6 6 p. (Materials Research Society Symposium Proceedings; vol. 1409).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations
2009

Characterizing antireflection coatings on textured mono-crystalline silicon with spectroscopic ellipsometry

Sun, J., Saenger, M. F., Schubert, M., Hilfiker, J. N., Synowicki, R., Herzinger, C. M. & Woollam, J. A., 2009, 2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009. p. 1407-1411 5 p. 5411301. (Conference Record of the IEEE Photovoltaic Specialists Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Infrared ellipsometric characterization of silicon nitride films on textured Si photovoltaic cells

Saenger, M. F., Schädel, M., Hofmann, T., Hilfiker, J., Sun, J., Tiwald, T., Schubert, M. & Woollam, J. A., 2009, Materials Research Society Symposium Proceedings - Photovoltaic Materials and Manufacturing Issues. p. 145-150 6 p. (Materials Research Society Symposium Proceedings; vol. 1123).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Materials characterization using THz ellipsometry

Hofmann, T., Herzinger, C. M., Woollam, J. A. & Schubert, M., 2009, Materials Research for Terahertz Technology Development. Materials Research Society, p. 19-24 6 p. (Materials Research Society Symposium Proceedings; vol. 1163).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Terahertz ellipsometry using electron-beam based sources

Hofmann, T., Herzinger, C. M., Schade, U., Mross, M., Woollam, J. A. & Schubert, M., 2009, Materials Research Society Symposium Proceedings - Performance and Reliability of Semiconductor Devices. p. 85-90 6 p. (Materials Research Society Symposium Proceedings; vol. 1108).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations
2008

Monitoring organic thin film growth in aqueous solution in-situ with a combined Quartz Crystal Microbalance and ellipsometry

Sarkar, A., Viitala, T., Hofrnann, T., Tiwald, T. E., Woollam, J. A., Kjerstad, A., Laderian, B. & Schubert, M., 2008, In-Situ Studies Across Spatial and Temporal Scales for Nanoscience and Technology. Materials Research Society, p. 53-59 7 p. (Materials Research Society Symposium Proceedings; vol. 1146).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1996

Self-calibrating modulation ellipsometer

Ducharme, S., Machlab, H., Snyder, P. G., Woollam, J. A. & Synowicki, R. A., 1996, Proceedings of SPIE - The International Society for Optical Engineering. DePaula, R. P. & Berthold, J. W. III. (eds.). p. 373-384 12 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 2839).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1995

Real-time space materials degradation monitor using ellipsometer

Machlab, H., Synowicki, R. A., Ducharme, S. P., Snyder, P. G. & Woollam, J. A., 1995, Space Programs and Technologies Conference. American Institute of Aeronautics and Astronautics Inc, AIAA, p. 1-5 5 p. (1995 Space Programs and Technologies Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1994

In situ and ex situ applications of spectroscopic ellipsometry

Woollam, J. A., Johs, B., McGahan, W. A., Snyder, P. G., Hale, J. & Yao, H. W., 1994, Diagnostic Techniques for Semiconductor Materials Processing. Publ by Materials Research Society, p. 15-25 11 p. (Materials Research Society Symposium Proceedings; vol. 324).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations
1993

In situ studies of electron cyclotron resonance plasma etching of semiconductors by spectroscopic ellipsometry

Nafis, S., Ianno, N. J., Snyder, P. G., Woollam, J. A. & Blaine, J., 1993, Materials Research Society Symposium Proceedings. Publ by Materials Research Society, p. 819-824 6 p. (Materials Research Society Symposium Proceedings; vol. 279).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1992

Complete measurement of Kerr parameters by using rotating-analyzer magneto-optic spectroscopy

Chen, L. Y., Feng, X. W., Tian, Y. S., Su, Y., Ma, H. Z., Qian, Y. H., Shen, D. F. & Woollam, J. A., 1992, Proceedings of SPIE - The International Society for Optical Engineering. Publ by Int Soc for Optical Engineering, p. 307-315 9 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 1746).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

17 Scopus citations

In-situ and ex-situ ellipsometric characterization for semiconductor technology (Invited Paper)

Woollam, J. A., Snyder, P. G., Yao, H. & Johs, B. D., 1992, Proceedings of SPIE - The International Society for Optical Engineering. Publ by Int Soc for Optical Engineering, p. 246-257 12 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 1678).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Scopus citations
1991

Optimization of quadrilayer structures for various magneto-optical recording materials

He, P., McGahan, W. A. & Woollam, J. A., 1991, Proceedings of SPIE - The International Society for Optical Engineering. Publ by Int Soc for Optical Engineering, p. 401-411 11 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 1499).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Scopus citations
1990

Pulsed laser deposition of tl-ca-ba-cu-o films

Ianno, N. J., Liou, S. H., Woollam, J. A., Thompson, D. & Johs, B., 1990, Proceedings of SPIE - The International Society for Optical Engineering. Bhasin, K. B. & Heinen, V. O. (eds.). Publ by Int Soc for Optical Engineering, p. 24-37 14 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 1292).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1987

STUDY OF ION IMPLANTED COPPER LASER MIRRORS BY SPECTROSCOPIC ELLIPSOMETRY.

Snyder, P. G., Massengale, A., Memarzadeh, K., Woollam, J. A., Ingram, D. C. & Pronko, P. P., 1987, Materials Research Society Symposia Proceedings. Thompson, M. O., Picraux, S. T. & Williams, J. S. (eds.). Materials Research Soc, p. 535-540 6 p. (Materials Research Society Symposia Proceedings; vol. 74).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Scopus citations
1983

ELECTRICAL PROPERTIES OF SbCl//5, ICl, HNO//3, and Br//2 INTERCALATED PITCH BASED CARBON FIBERS.

Natarajan, V. & Woollam, J. A., 1983, Materials Research Society Symposia Proceedings. North-Holland, p. 45-50 6 p. (Materials Research Society Symposia Proceedings; vol. 20).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations