• 8097 Citations
  • 43 h-Index
1965 …2018

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Article
2018

Elevated temperature dependence of the anisotropic visible-to-ultraviolet dielectric function of monoclinic β -Ga2O3

Mock, A., Vanderslice, J., Korlacki, R., Woollam, J. A. & Schubert, M., Jan 22 2018, In : Applied Physics Letters. 112, 4, 041905.

Research output: Contribution to journalArticle

5 Scopus citations
2017
2 Scopus citations

Screening effects in metal sculptured thin films studied with terahertz Mueller matrix ellipsometry

Hofmann, T., Knight, S., Sekora, D., Schmidt, D., Herzinger, C. M., Woollam, J. A., Schubert, E. & Schubert, M., Nov 1 2017, In : Applied Surface Science. 421, p. 513-517 5 p.

Research output: Contribution to journalArticle

4 Scopus citations
2014

Invited Article: An integrated mid-infrared, far-infrared, and terahertz optical Hall effect instrument

Kühne, P., Herzinger, C. M., Schubert, M., Woollam, J. A. & Hofmann, T., Jul 2014, In : Review of Scientific Instruments. 85, 7, 071301.

Research output: Contribution to journalArticle

25 Scopus citations
2013

Polarization selection rules for inter-landau-level transitions in epitaxial graphene revealed by the infrared optical hall effect

Kühne, P., Darakchieva, V., Yakimova, R., Tedesco, J. D., Myers-Ward, R. L., Eddy, C. R., Gaskill, D. K., Herzinger, C. M., Woollam, J. A., Schubert, M. & Hofmann, T., Aug 14 2013, In : Physical Review Letters. 111, 7, 077402.

Research output: Contribution to journalArticle

15 Scopus citations
2012

Temperature dependent effective mass in AlGaN/GaN high electron mobility transistor structures

Hofmann, T., Kühne, P., Schöche, S., Chen, J. T., Forsberg, U., Janzén, E., Ben Sedrine, N., Herzinger, C. M., Woollam, J. A., Schubert, M. & Darakchieva, V., Nov 5 2012, In : Applied Physics Letters. 101, 19, 192102.

Research output: Contribution to journalArticle

24 Scopus citations
2011

Hole-channel conductivity in epitaxial graphene determined by terahertz optical-Hall effect and midinfrared ellipsometry

Hofmann, T., Boosalis, A., Kühne, P., Herzinger, C. M., Woollam, J. A., Gaskill, D. K., Tedesco, J. L. & Schubert, M., Jan 24 2011, In : Applied Physics Letters. 98, 4, 041906.

Research output: Contribution to journalArticle

36 Scopus citations

Terahertz ellipsometry and terahertz optical-Hall effect

Hofmann, T., Herzinger, C. M., Tedesco, J. L., Gaskill, D. K., Woollam, J. A. & Schubert, M., Feb 28 2011, In : Thin Solid Films. 519, 9, p. 2593-2600 8 p.

Research output: Contribution to journalArticle

34 Scopus citations

Terahertz optical-Hall effect characterization of two-dimensional electron gas properties in AlGaN/GaN high electron mobility transistor structures

Schöche, S., Shi, J., Boosalis, A., Kühne, P., Herzinger, C. M., Woollam, J. A., Schaff, W. J., Eastman, L. F., Schubert, M. & Hofmann, T., Feb 28 2011, In : Applied Physics Letters. 98, 9, 092103.

Research output: Contribution to journalArticle

18 Scopus citations

THz dielectric anisotropy of metal slanted columnar thin films

Hofmann, T., Schmidt, D., Boosalis, A., Khne, P., Skomski, R., Herzinger, C. M., Woollam, J. A., Schubert, M. & Schubert, E., Aug 22 2011, In : Applied Physics Letters. 99, 8, 081903.

Research output: Contribution to journalArticle

29 Scopus citations
2010

Spectroscopic ellipsometry characterization of SiNx antireflection films on textured multicrystalline and monocrystalline silicon solar cells

Saenger, M. F., Sun, J., Schädel, M., Hilfiker, J., Schubert, M. & Woollam, J. A., Jan 31 2010, In : Thin Solid Films. 518, 7, p. 1830-1834 5 p.

Research output: Contribution to journalArticle

20 Scopus citations

Variable-wavelength frequency-domain terahertz ellipsometry

Hofmann, T., Herzinger, C. M., Boosalis, A., Tiwald, T. E., Woollam, J. A. & Schubert, M., 2010, In : Review of Scientific Instruments. 81, 2, 023101.

Research output: Contribution to journalArticle

59 Scopus citations
2009

Hole diffusion profile in a p- p+ silicon homojunction determined by terahertz and midinfrared spectroscopic ellipsometry

Hofmann, T., Herzinger, C. M., Tiwald, T. E., Woollam, J. A. & Schubert, M., 2009, In : Applied Physics Letters. 95, 3, 032102.

Research output: Contribution to journalArticle

18 Scopus citations
2008
7 Scopus citations
2007

Repeatability of ellipsometric data in cholera toxin GM1-ELISA structures

Castro, L. G., Thompson, D. W., Tiwald, T., Berberov, E. M. & Woollam, J. A., Apr 15 2007, In : Surface Science. 601, 8, p. 1795-1803 9 p.

Research output: Contribution to journalArticle

6 Scopus citations

Vacuum ultraviolet optical analysis of spin-cast chitosan films modified by succinic anhydride and glycidyl phenyl ether

Nosal, W. H., Thompson, D. W., Tiwald, T. E., Sarkar, S., Subramanian, A. & Woollam, J. A., Sep 2007, In : Surface and Interface Analysis. 39, 9, p. 747-751 5 p.

Research output: Contribution to journalArticle

2 Scopus citations
2006

Physical and chemical properties of sputter-deposited TaCxN y films

Aouadi, S. M., Zhang, Y., Basnyat, P., Stadler, S., Filip, P., Williams, M., Hilfiker, J. N., Singh, N. & Woollam, J. A., Feb 15 2006, In : Journal of Physics Condensed Matter. 18, 6, p. 1977-1986 10 p.

Research output: Contribution to journalArticle

13 Scopus citations

Vacuum ultra-violet spectroscopic ellipsometry study of single-and multi-phase nitride protective films

Aouadi, S. M., Bohnhoff, A., Amriou, T., Williams, M., Hilfiker, J. N., Singh, N. & Woollam, J. A., Aug 16 2006, In : Journal of Physics Condensed Matter. 18, 32, p. S1691-S1701 S01.

Research output: Contribution to journalArticle

9 Scopus citations
2005

Carbonic anhydrase adsorption in porous silicon studied with infrared ellipsometry

Arwin, H., Karlsson, L. M., Kozarcanin, A., Thompson, D. W., Tiwald, T. & Woollam, J. A., Jun 2005, In : Physica Status Solidi (A) Applications and Materials Science. 202, 8, p. 1688-1692 5 p.

Research output: Contribution to journalArticle

3 Scopus citations

Enhancing infrared response of adsorbed biomaterials using ellipsometry and textured surfaces

Thompson, D. W. & Woollam, J. A., 2005, In : Spectroscopy. 19, 3, p. 147-164 18 p.

Research output: Contribution to journalArticle

Open Access
2 Scopus citations

Infrared optical properties and AFM of spin-cast chitosan films chemically modified with 1,2 Epoxy-3-phenoxy-propane

Nosal, W. H., Thompson, D. W., Yan, L., Sarkar, S., Subramanian, A. & Woollam, J. A., Nov 25 2005, In : Colloids and Surfaces B: Biointerfaces. 46, 1, p. 26-31 6 p.

Research output: Contribution to journalArticle

10 Scopus citations

Optical characterization of porous alumina from vacuum ultraviolet to midinfrared

Thompson, D. W., Snyder, P. G., Castro, L., Yan, L., Kaipa, P. & Woollam, J. A., 2005, In : Journal of Applied Physics. 97, 11, 113511.

Research output: Contribution to journalArticle

37 Scopus citations

Quantitative oscillator analysis of IR-optical spectra on spin-cast chitosan films

Nosal, W. H., Thompson, D. W., Sarkar, S., Subramanian, A. & Woollam, J. A., 2005, In : Spectroscopy. 19, 5-6, p. 267-274 8 p.

Research output: Contribution to journalArticle

Open Access
1 Scopus citations

UV-vis-infrared optical and AFM study of spin-cast chitosan films

Nosal, W. H., Thompson, D. W., Yan, L., Sarkar, S., Subramanian, A. & Woollam, J. A., Jul 10 2005, In : Colloids and Surfaces B: Biointerfaces. 43, 3-4, p. 131-137 7 p.

Research output: Contribution to journalArticle

27 Scopus citations
2004

Gold-alumina cermet photothermal films

Woods, B. W., Thompson, D. W. & Woollam, J. A., Dec 22 2004, In : Thin Solid Films. 469-470, SPEC. ISS., p. 31-37 7 p.

Research output: Contribution to journalArticle

6 Scopus citations
3 Scopus citations

Synthesis and characterization of albumin binding surfaces for implantable surfaces

Subramanian, A., Sarkar, S., Woollam, J. A. & Nosal, W. H., 2004, In : Biomedical Sciences Instrumentation. 40, p. 1-6 6 p.

Research output: Contribution to journalArticle

8 Scopus citations
2003

Progress in spectroscopic ellipsometry: Applications from vacuum ultraviolet to infrared

Hilfiker, J. N., Bungay, C. L., Synowicki, R. A., Tiwald, T. E., Herzinger, C. M., Johs, B., Pribil, G. K. & Woollam, J. A., Jul 2003, In : Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films. 21, 4, p. 1103-1108 6 p.

Research output: Contribution to journalArticle

51 Scopus citations
2002

Low-orbit-environment protective coating for all-solid-state electrochromic surface heat radiation control devices

Franke, E., Neumann, H., Schubert, M., Trimble, C. L., Yan, L. & Woollam, J. A., Mar 1 2002, In : Surface and Coatings Technology. 151-152, p. 285-288 4 p.

Research output: Contribution to journalArticle

27 Scopus citations

Optical constants and roughness study of dc magnetron sputtered iridium films

Yan, L. & Woollam, J. A., Oct 15 2002, In : Journal of Applied Physics. 92, 8, p. 4386-4392 7 p.

Research output: Contribution to journalArticle

27 Scopus citations

Oxygen plasma effects on optical properties of ZnSe films

Yan, L., Woollam, J. A. & Franke, E., May 2002, In : Journal of Vacuum Science and Technology, Part A: Vacuum, Surfaces and Films. 20, 3, p. 693-701 9 p.

Research output: Contribution to journalArticle

18 Scopus citations
2001

Giant photoresistivity and optically controlled switching in self-assembled nanowires

Kouklin, N., Menon, L., Wong, A. Z., Thompson, D. W., Woollam, J. A., Williams, P. F. & Bandyopadhyay, S., Dec 24 2001, In : Applied Physics Letters. 79, 26, p. 4423-4425 3 p.

Research output: Contribution to journalArticle

117 Scopus citations

Infrared ellipsometry - A novel tool for characterization of group-III nitride heterostructures for optoelectronic device applications

Schubert, M., Kasic, A., Einfeldt, S., Hommel, D., Köhler, U., As, D. J., Off, J., Kuhn, B., Scholz, F. & Woollam, J. A., Nov 2001, In : Physica Status Solidi (B) Basic Research. 228, 2, p. 437-440 4 p.

Research output: Contribution to journalArticle

13 Scopus citations

Infrared ellipsometry characterization of porous silicon Bragg reflectors

Zangooie, S., Zangooie, S., Schubert, M., Trimble, C., Thompson, D. W. & Woollam, J. A., Feb 20 2001, In : Applied optics. 40, 6, p. 906-912 7 p.

Research output: Contribution to journalArticle

22 Scopus citations

Infrared optical properties of aged porous GaAs

Zangooie, S., Schubert, M., Tiwald, T. E. & Woollam, J. A., May 2001, In : Journal of Materials Research. 16, 5, p. 1241-1244 4 p.

Research output: Contribution to journalArticle

4 Scopus citations

Infrared response of multiple-component free-carrier plasma in heavily doped p-type GaAs

Zangooie, S., Schubert, M., Thompson, D. W. & Woollam, J. A., Feb 12 2001, In : Applied Physics Letters. 78, 7, p. 937-939 3 p.

Research output: Contribution to journalArticle

13 Scopus citations

Infrared spectroscopic ellipsometry for nondestructive characterization of free-carrier and crystal-structure properties of group-III-nitride semiconductor device heterostructures

Schubert, M., Kasic, A., Figge, S., Diesselberg, M., Einfeldt, S., Hommel, D., Köhler, U., Josef As, D., Off, J., Kuhn, B., Scholz, F., Woollam, J. A. & Herzinger, C. M., 2001, In : Proceedings of SPIE - The International Society for Optical Engineering. 4449, p. 58-68 11 p.

Research output: Contribution to journalArticle

4 Scopus citations

Mechanical, geometrical, and electrical characterization of silicon membranes for open stencil masks

Sossna, E., Degen, A., Rangelow, I. W., Drzik, M., Hudek, P., Tiwald, T. E. & Woollam, J. A., Nov 2001, In : Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 19, 6, p. 2665-2670 6 p.

Research output: Contribution to journalArticle

3 Scopus citations

Optical properties of amorphous and polycrystalline tantalum oxide thin films measured by spectroscopic ellipsometry from 0.03 to 8.5 eV

Franke, E., Schubert, M., Trimble, C. L., DeVries, M. J. & Woollam, J. A., Jun 1 2001, In : Thin Solid Films. 388, 1-2, p. 283-289 7 p.

Research output: Contribution to journalArticle

27 Scopus citations

Recent developments in spectroscopic ellipsometry for in situ applications

Johs, B., Hale, J., Ianno, N. J., Herzinger, C. M., Tiwald, T. & Woollam, J. A., 2001, In : Proceedings of SPIE - The International Society for Optical Engineering. 4449, p. 41-57 17 p.

Research output: Contribution to journalArticle

39 Scopus citations
18 Scopus citations
2000

All-solid-state electrochromic reflectance device for emittance modulation in the far-infrared spectral region

Franke, E. B., Trimble, C. L., Schubert, M., Woollam, J. A. & Hale, J. S., Aug 14 2000, In : Applied Physics Letters. 77, 7, p. 930-932 3 p.

Research output: Contribution to journalArticle

48 Scopus citations

Characterization of UV irradiated space application polymers by spectroscopic ellipsometry

Bungay, C. L., Tiwald, T. E., Devries, M. J., Dworak, B. J. & Woollam, J. A., 2000, In : Polymer Engineering and Science. 40, 2, p. 300-309 10 p.

Research output: Contribution to journalArticle

8 Scopus citations

Dielectric function of amorphous tantalum oxide from the far infrared to the deep ultraviolet spectral region measured by spectroscopic ellipsometry

Franke, E., Trimble, C. L., DeVries, M. J., Woollam, J. A., Schubert, M. & Frost, F., Nov 1 2000, In : Journal of Applied Physics. 88, 9, p. 5166-5174 9 p.

Research output: Contribution to journalArticle

65 Scopus citations

Dielectric tensor for interfaces and individual layers in magnetic multilayer structures

Gao, X., Devries, M. J., Thompson, D. W. & Woollam, J. A., Sep 1 2000, In : Journal of Applied Physics. 88, 5, p. 2775-2780 6 p.

Research output: Contribution to journalArticle

1 Scopus citations

Ellipsometric characterization of thin porous GaAs layers formed in HF solutions

Zangooie, S. & Woollam, J. A., 2000, In : Journal of Materials Science Letters. 19, 24, p. 2171-2173 3 p.

Research output: Contribution to journalArticle

3 Scopus citations

Infrared switching electrochromic devices based on tungsten oxide

Franke, E. B., Trimble, C. L., Hale, J. S., Schubert, M. & Woollam, J. A., Nov 15 2000, In : Journal of Applied Physics. 88, 10, p. 5777-5784 8 p.

Research output: Contribution to journalArticle

83 Scopus citations

In situ ellipsometry growth characterization of dual ion beam deposited boron nitride thin films

Franke, E., Schubert, M., Woollam, J. A., Hecht, J. D., Wagner, G., Neumann, H. & Bigl, F., Mar 2000, In : Journal of Applied Physics. 87, 5, p. 2593-2599 7 p.

Research output: Contribution to journalArticle

17 Scopus citations

Optical properties of bulk and thin-film SrTiO3 on Si and Pt

Zollner, S., Demkov, A. A., Liu, R., Fejes, P. L., Gregory, R. B., Alluri, P., Curless, J. A., Yu, Z., Ramdani, J., Droopad, R., Tiwald, T. E., Hilfiker, J. N. & Woollam, J. A., 2000, In : Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 18, 4, p. 2242-2254 13 p.

Research output: Contribution to journalArticle

88 Scopus citations

Phonons and free carriers in a strained hexagonal GaN-AIN superlattice measured by infrared ellipsometry and raman spectroscopy

Schubert, M., Kasic, A., Tiwald, T. E., Woollam, J. A., Harle, V. & Scholz, F., 2000, In : Materials Research Society Symposium - Proceedings. 595, p. W11391-W11396

Research output: Contribution to journalArticle

1 Scopus citations