A mapping-by-sequencing tool for searching causative genes in mutants

Shangang Jia, David Holding, Chi Zhang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Bulk segregation analysis mapping is a widely used approach in functional genomics, especially now that low sequencing costs make mapping-by-sequencing realistic. However, the huge data processing required is not trivial. To help in this regard, we utilized our population of maize kernel mutants to develop a new mapping-by-sequencing analysis software tool, (MSA), to identify causative genes based on the DNA and RNA level variations in mutant pools. It is designed to identify the association regions, which show linkage disequilibrium to causative mutations, and place linkage peaks on the chromosomes. The method involves the comparison of mutant and normal pools of F2 individuals, and the parents for F2s can be also used alongside the two pools. It allows simultaneous analysis of multiple mutants and multiple normal samples, which can reduce the noise to make linkage peaks.

Original languageEnglish (US)
Title of host publication2017 IEEE International Conference on Electro Information Technology, EIT 2017
PublisherIEEE Computer Society
Pages338-340
Number of pages3
ISBN (Electronic)9781509047673
DOIs
StatePublished - Sep 27 2017
Event2017 IEEE International Conference on Electro Information Technology, EIT 2017 - Lincoln, United States
Duration: May 14 2017May 17 2017

Publication series

NameIEEE International Conference on Electro Information Technology
ISSN (Print)2154-0357
ISSN (Electronic)2154-0373

Other

Other2017 IEEE International Conference on Electro Information Technology, EIT 2017
Country/TerritoryUnited States
CityLincoln
Period5/14/175/17/17

Keywords

  • BSR-seq
  • bulk segregation analysis
  • causative mutation
  • mapping-by-sequencing
  • mutant

ASJC Scopus subject areas

  • Computer Science Applications
  • Information Systems
  • Control and Systems Engineering
  • Electrical and Electronic Engineering

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