Ab initio calculations and ellipsometry measurements of the optical properties of the layered semiconductor In4 Se3

L. Makinistian, E. A. Albanesi, N. V. Gonzalez Lemus, A. G. Petukhov, D. Schmidt, E. Schubert, M. Schubert, Ya B. Losovyj, P. Galiy, P. Dowben

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