Analysis of test clusters for regression testing

Bo Guo, Mahadevan Subramaniam, Parvathi Chundi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

Samples from clusters of tests are used to automatically predict if tests are to be re-clustered for a modified program. Tests likely to be affected by line level changes are included in the samples by analyzing their execution profiles based on spatial locality. Initial experiments show that the approach can potentially avoid re-clustering in many cases.

Original languageEnglish (US)
Title of host publicationProceedings - IEEE 5th International Conference on Software Testing, Verification and Validation, ICST 2012
Number of pages1
DOIs
StatePublished - 2012
Event5th IEEE International Conference on Software Testing, Verification and Validation, ICST 2012 - Montreal, QC, Canada
Duration: Apr 17 2012Apr 21 2012

Publication series

NameProceedings - IEEE 5th International Conference on Software Testing, Verification and Validation, ICST 2012

Conference

Conference5th IEEE International Conference on Software Testing, Verification and Validation, ICST 2012
CountryCanada
CityMontreal, QC
Period4/17/124/21/12

Keywords

  • Cluster Analysis
  • Re-clustering
  • Regression Test Selection

ASJC Scopus subject areas

  • Software

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  • Cite this

    Guo, B., Subramaniam, M., & Chundi, P. (2012). Analysis of test clusters for regression testing. In Proceedings - IEEE 5th International Conference on Software Testing, Verification and Validation, ICST 2012 [6200177] (Proceedings - IEEE 5th International Conference on Software Testing, Verification and Validation, ICST 2012). https://doi.org/10.1109/ICST.2012.165