TY - JOUR
T1 - Analysis of variable angle spectroscopic ellipsometric measurements on uncoated magneto-optic materials
AU - McGahan, William A.
AU - Shan, Z. S.
AU - Woollam, John A.
PY - 1988/12
Y1 - 1988/12
N2 - We have adapted variable angle spectroscopic ellipsometry (VASE) to the measurement of magneto-optic effects, specifically, the polar Kerr effect. The complete dielectric function tensor, including complex diagonal and off-diagonal elements, can be measured on one instrument. The index of refraction, extinction coefficient, Kerr rotation (p- and s-plane), and Kerr ellipticity (p- and s-plane) can be extracted from the same data. Equations for the analysis of raw ellipsometric data are given, and representative data for the Dy/Co multilayer system are presented.
AB - We have adapted variable angle spectroscopic ellipsometry (VASE) to the measurement of magneto-optic effects, specifically, the polar Kerr effect. The complete dielectric function tensor, including complex diagonal and off-diagonal elements, can be measured on one instrument. The index of refraction, extinction coefficient, Kerr rotation (p- and s-plane), and Kerr ellipticity (p- and s-plane) can be extracted from the same data. Equations for the analysis of raw ellipsometric data are given, and representative data for the Dy/Co multilayer system are presented.
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M3 - Article
AN - SCOPUS:0024133258
SN - 0277-9374
VL - 8
SP - 209
EP - 216
JO - Applied physics communications
JF - Applied physics communications
IS - 4
ER -