Abstract
A systematic study of photoluminescence (PL) of Er and O ion implanted and annealed n-type GaN grown on R-plane sapphire (Al2O3) was performed. The Er implants ranged from 2×1013 to 1×1015 Er++/cm2, and the O co-implants ranged from 1014 to 1016 O+/cm2. The resulting nine different combinations of GaN:Er,O were annealed at 600°C (4 hrs. in N2), 700°C (1.5 hrs. in N2), 800°C (0.75 hr. in NH3), and 900°C (0.5 hr. in NH3). Following each annealing step, the Er3+-related PL at 1.54 μm was measured from each sample at 77 K, when pumped directly with ≈135 mW of power at 980 nm. The three samples with the highest dose of Er (1×1015 Er++/cm2), regardless of O co-dopant dose, yielded the strongest PL peak intensity at 1.54 μm after all the anneals. The integrated PL from 1.52 to 1.58 μm was reduced by 62% when going from 77 K to room temperature (RT).
Original language | English (US) |
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Pages (from-to) | 199-204 |
Number of pages | 6 |
Journal | Materials Research Society Symposium - Proceedings |
Volume | 422 |
DOIs | |
State | Published - 1996 |
Externally published | Yes |
Event | Proceedings of the 1996 MRS Spring Symposium - San Francisco, CA, USA Duration: Apr 8 1996 → Apr 12 1996 |
ASJC Scopus subject areas
- General Materials Science
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering