Automated Stem Angle Determination for Temporal Plant Phenotyping Analysis

Sruti Das Choudhury, Saptarsi Goswami, Srinidhi Bashyam, Tala Awada, Ashok Samal

Research output: Chapter in Book/Report/Conference proceedingConference contribution

24 Scopus citations

Abstract

Image-based plant phenotyping analysis refers to the monitoring and quantification of phenotyping traits by analyzing images of the plants captured by different types of cameras at regular intervals in a controlled environment. Extracting meaningful phenotypes for temporal phenotyping analysis by considering individual parts of a plant, e.g., leaves and stem, using computer-vision based techniques remains a critical bottleneck due to constantly increasing complexity in plant architecture with variations in self-occlusions and phyllotaxy. The paper introduces an algorithm to compute the stem angle, a potential measure for plants' susceptibility to lodging, i.e., the bending of stem of the plant. Annual yield losses due to stem lodging in the U.S. range between 5 and 25%. In addition to outright yield losses, grain quality may also decline as a result of stem lodging. The algorithm to compute stem angle involves the identification of leaf-tips and leaf-junctions based on a graph theoretic approach. The efficacy of the proposed method is demonstrated based on experimental analysis on a publicly available dataset called Panicoid Phenomap-1. A time-series clustering analysis is also performed on the values of stem angles for a significant time interval during vegetative stage life cycle of the maize plants. This analysis effectively summarizes the temporal patterns of the stem angles into three main groups, which provides further insight into genotype specific behavior of the plants. A comparison of genotypic purity using time series analysis establishes that the temporal variation of the stem angles is likely to be regulated by genetic variation under similar environmental conditions.

Original languageEnglish (US)
Title of host publicationProceedings - 2017 IEEE International Conference on Computer Vision Workshops, ICCVW 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2022-2029
Number of pages8
ISBN (Electronic)9781538610343
DOIs
StatePublished - Jul 1 2017
Event16th IEEE International Conference on Computer Vision Workshops, ICCVW 2017 - Venice, Italy
Duration: Oct 22 2017Oct 29 2017

Publication series

NameProceedings - 2017 IEEE International Conference on Computer Vision Workshops, ICCVW 2017
Volume2018-January

Other

Other16th IEEE International Conference on Computer Vision Workshops, ICCVW 2017
Country/TerritoryItaly
CityVenice
Period10/22/1710/29/17

ASJC Scopus subject areas

  • Computer Science Applications
  • Computer Vision and Pattern Recognition

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