Birefringence and reflectivity of single-crystal by generalized ellipsometry

J. Hecht, A. Eifler, V. Riede, M. Schubert

Research output: Contribution to journalArticle

39 Scopus citations

Abstract

Transmission and reflection generalized variable-angle spectroscopic ellipsometry and polarized transmission intensity measurements over the photon energy range from 0.74 to 5.0 eV have been used to characterize the optical properties of the ordered-vacancy compound (Formula presented) We report the dispersion of the uniaxial refractive index below the band gap. The onset of weak absorption indicates the fundamental band edge at about 2.95 eV, but does not reveal the nature of the lowest band-to-band transition. Above the fundamental band gap we assign four possible critical-point structures from a line-shape analysis of the sample dielectric function.

Original languageEnglish (US)
Pages (from-to)7037-7042
Number of pages6
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume57
Issue number12
DOIs
StatePublished - 1998

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Fingerprint Dive into the research topics of 'Birefringence and reflectivity of single-crystal by generalized ellipsometry'. Together they form a unique fingerprint.

  • Cite this