Birefringence and reflectivity of single-crystal by generalized ellipsometry

J. Hecht, A. Eifler, V. Riede, M. Schubert

Research output: Contribution to journalArticlepeer-review

42 Scopus citations


Transmission and reflection generalized variable-angle spectroscopic ellipsometry and polarized transmission intensity measurements over the photon energy range from 0.74 to 5.0 eV have been used to characterize the optical properties of the ordered-vacancy compound (Formula presented) We report the dispersion of the uniaxial refractive index below the band gap. The onset of weak absorption indicates the fundamental band edge at about 2.95 eV, but does not reveal the nature of the lowest band-to-band transition. Above the fundamental band gap we assign four possible critical-point structures from a line-shape analysis of the sample dielectric function.

Original languageEnglish (US)
Pages (from-to)7037-7042
Number of pages6
JournalPhysical Review B - Condensed Matter and Materials Physics
Issue number12
StatePublished - 1998
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics


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