Infrared spectroscopic ellipsometry analysis of poly(3,4-ethylenedioxy thiophene) (PEDOT)/poly(styrenesulfonate) (PSS) polymer layers on p- and n-Si was performed. The classical Drude optical conductivity model was applied to obtain the optical conductivity parameters. Charge-carrier redistribution phenomena were observed within layers of few nanometer thickness at the organic-inorganic interface. The results demonstrated the use of infrared ellipsometry for polymer thin-layer analysis.
|Original language||English (US)|
|Number of pages||3|
|Journal||Applied Physics Letters|
|State||Published - Feb 23 2004|
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)