Carrier redistribution in organic/inorganic (poly(3,4-ethylenedioxy thiophene/poly(styrenesulfonate)polymer)-Si) heterojunction determined from infrared ellipsometry

M. Schubert; C. Bundesmann; H. V. Wenckstern; G. Jakopic; A. Haase; N. K. Persson; F. Zhang; H. Arwin; O. Inganäs

doi:10.1063/1.1649822

Carrier redistribution in organic/inorganic (poly(3,4-ethylenedioxy thiophene/poly(styrenesulfonate)polymer)-Si) heterojunction determined from infrared ellipsometry

M. Schubert, C. Bundesmann, H. V. Wenckstern, G. Jakopic, A. Haase, N. K. Persson, F. Zhang, H. Arwin, O. Inganäs

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15 Scopus citations

Abstract

Infrared spectroscopic ellipsometry analysis of poly(3,4-ethylenedioxy thiophene) (PEDOT)/poly(styrenesulfonate) (PSS) polymer layers on p- and n-Si was performed. The classical Drude optical conductivity model was applied to obtain the optical conductivity parameters. Charge-carrier redistribution phenomena were observed within layers of few nanometer thickness at the organic-inorganic interface. The results demonstrated the use of infrared ellipsometry for polymer thin-layer analysis.

Original language	English (US)
Pages (from-to)	1311-1313
Number of pages	3
Journal	Applied Physics Letters
Volume	84
Issue number	8
DOIs	https://doi.org/10.1063/1.1649822
State	Published - Feb 23 2004
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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Schubert, M., Bundesmann, C., Wenckstern, H. V., Jakopic, G., Haase, A., Persson, N. K., Zhang, F., Arwin, H., & Inganäs, O. (2004). Carrier redistribution in organic/inorganic (poly(3,4-ethylenedioxy thiophene/poly(styrenesulfonate)polymer)-Si) heterojunction determined from infrared ellipsometry. Applied Physics Letters, 84(8), 1311-1313. https://doi.org/10.1063/1.1649822

Schubert, M, Bundesmann, C, Wenckstern, HV, Jakopic, G, Haase, A, Persson, NK, Zhang, F, Arwin, H & Inganäs, O 2004, 'Carrier redistribution in organic/inorganic (poly(3,4-ethylenedioxy thiophene/poly(styrenesulfonate)polymer)-Si) heterojunction determined from infrared ellipsometry', Applied Physics Letters, vol. 84, no. 8, pp. 1311-1313. https://doi.org/10.1063/1.1649822

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abstract = "Infrared spectroscopic ellipsometry analysis of poly(3,4-ethylenedioxy thiophene) (PEDOT)/poly(styrenesulfonate) (PSS) polymer layers on p- and n-Si was performed. The classical Drude optical conductivity model was applied to obtain the optical conductivity parameters. Charge-carrier redistribution phenomena were observed within layers of few nanometer thickness at the organic-inorganic interface. The results demonstrated the use of infrared ellipsometry for polymer thin-layer analysis.",

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doi = "10.1063/1.1649822",

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T1 - Carrier redistribution in organic/inorganic (poly(3,4-ethylenedioxy thiophene/poly(styrenesulfonate)polymer)-Si) heterojunction determined from infrared ellipsometry

AU - Schubert, M.

AU - Bundesmann, C.

AU - Wenckstern, H. V.

AU - Jakopic, G.

AU - Haase, A.

AU - Persson, N. K.

AU - Zhang, F.

AU - Arwin, H.

AU - Inganäs, O.

PY - 2004/2/23

Y1 - 2004/2/23

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AB - Infrared spectroscopic ellipsometry analysis of poly(3,4-ethylenedioxy thiophene) (PEDOT)/poly(styrenesulfonate) (PSS) polymer layers on p- and n-Si was performed. The classical Drude optical conductivity model was applied to obtain the optical conductivity parameters. Charge-carrier redistribution phenomena were observed within layers of few nanometer thickness at the organic-inorganic interface. The results demonstrated the use of infrared ellipsometry for polymer thin-layer analysis.

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Carrier redistribution in organic/inorganic (poly(3,4-ethylenedioxy thiophene/poly(styrenesulfonate)polymer)-Si) heterojunction determined from infrared ellipsometry

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