Characterization of the native Cr2O3 oxide surface of CrO2

Ruihua Cheng; B. Xu; C. N. Borca; A. Sokolov; C. S. Yang; L. Yuan; S. H. Liou; B. Doudin; P. A. Dowben

doi:10.1063/1.1416474

Characterization of the native Cr₂O₃ oxide surface of CrO₂

Ruihua Cheng, B. Xu, C. N. Borca, A. Sokolov, C. S. Yang, L. Yuan, S. H. Liou, B. Doudin, P. A. Dowben

Research output: Contribution to journal › Article › peer-review

112 Scopus citations

Abstract

Using photoemission and inverse photoemission, we have been able to characterize the Cr₂O₃ oxide surface of CrO₂ thin films. The Cr₂O₃ surface oxide exhibits a band gap of about 3 eV, although the bulk CrO₂ is conducting. The thickness of this insulating Cr₂O₃ layer is twice the photoelectron escape depth which is about 2 nm thick. The effective Cr₂O₃ surface layer Debye temperature, describing motion normal to the surface, is about 370 K. From a comparison of CrO₂ films grown by different techniques, with different Cr₂O₃ content, evidence is provided that the CrO₂ may polarize the Cr₂O₃.

Original language	English (US)
Pages (from-to)	3122-3124
Number of pages	3
Journal	Applied Physics Letters
Volume	79
Issue number	19
DOIs	https://doi.org/10.1063/1.1416474
State	Published - Nov 5 2001

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

Access to Document

10.1063/1.1416474

Cite this

@article{996d3f19508a4fc7ab723093b62b34c6,

title = "Characterization of the native Cr2O3 oxide surface of CrO2",

abstract = "Using photoemission and inverse photoemission, we have been able to characterize the Cr2O3 oxide surface of CrO2 thin films. The Cr2O3 surface oxide exhibits a band gap of about 3 eV, although the bulk CrO2 is conducting. The thickness of this insulating Cr2O3 layer is twice the photoelectron escape depth which is about 2 nm thick. The effective Cr2O3 surface layer Debye temperature, describing motion normal to the surface, is about 370 K. From a comparison of CrO2 films grown by different techniques, with different Cr2O3 content, evidence is provided that the CrO2 may polarize the Cr2O3.",

author = "Ruihua Cheng and B. Xu and Borca, {C. N.} and A. Sokolov and Yang, {C. S.} and L. Yuan and Liou, {S. H.} and B. Doudin and Dowben, {P. A.}",

year = "2001",

month = nov,

day = "5",

doi = "10.1063/1.1416474",

language = "English (US)",

volume = "79",

pages = "3122--3124",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "19",

}

TY - JOUR

T1 - Characterization of the native Cr2O3 oxide surface of CrO2

AU - Cheng, Ruihua

AU - Xu, B.

AU - Borca, C. N.

AU - Sokolov, A.

AU - Yang, C. S.

AU - Yuan, L.

AU - Liou, S. H.

AU - Doudin, B.

AU - Dowben, P. A.

PY - 2001/11/5

Y1 - 2001/11/5

N2 - Using photoemission and inverse photoemission, we have been able to characterize the Cr2O3 oxide surface of CrO2 thin films. The Cr2O3 surface oxide exhibits a band gap of about 3 eV, although the bulk CrO2 is conducting. The thickness of this insulating Cr2O3 layer is twice the photoelectron escape depth which is about 2 nm thick. The effective Cr2O3 surface layer Debye temperature, describing motion normal to the surface, is about 370 K. From a comparison of CrO2 films grown by different techniques, with different Cr2O3 content, evidence is provided that the CrO2 may polarize the Cr2O3.

AB - Using photoemission and inverse photoemission, we have been able to characterize the Cr2O3 oxide surface of CrO2 thin films. The Cr2O3 surface oxide exhibits a band gap of about 3 eV, although the bulk CrO2 is conducting. The thickness of this insulating Cr2O3 layer is twice the photoelectron escape depth which is about 2 nm thick. The effective Cr2O3 surface layer Debye temperature, describing motion normal to the surface, is about 370 K. From a comparison of CrO2 films grown by different techniques, with different Cr2O3 content, evidence is provided that the CrO2 may polarize the Cr2O3.

UR - http://www.scopus.com/inward/record.url?scp=0001121667&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0001121667&partnerID=8YFLogxK

U2 - 10.1063/1.1416474

DO - 10.1063/1.1416474

M3 - Article

AN - SCOPUS:0001121667

SN - 0003-6951

VL - 79

SP - 3122

EP - 3124

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 19

ER -

Characterization of the native Cr₂O₃ oxide surface of CrO₂

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this