Combined optical and acoustical method for determination of thickness and porosity of transparent organic layers below the ultra-thin film limit

K. B. Rodenhausen, T. Kasputis, A. K. Pannier, J. Y. Gerasimov, R. Y. Lai, M. Solinsky, T. E. Tiwald, H. Wang, A. Sarkar, T. Hofmann, N. Ianno, M. Schubert

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Engineering

Material Science