Comment on "Steady-state temperature profile for a thin-film resistor under bias" [J. Appl. Phys. 72, 3862 (1992)]

Yong Feng Lu

doi:10.1063/1.355308

Comment on "Steady-state temperature profile for a thin-film resistor under bias" [J. Appl. Phys. 72, 3862 (1992)]

Yong Feng Lu

Research output: Contribution to journal › Review article › peer-review

1 Scopus citations

Abstract

This comment is to point out that the temperature dependence of the thermal conductivity should be taken into account in computing the temperature distribution in substrate material (such as silicon) with temperature-dependent thermal conductivity. Ignoring the temperature dependence of the thermal conductivity will lead to a large error in the calculated results.

Original language	English (US)
Pages (from-to)	5290
Number of pages	1
Journal	Journal of Applied Physics
Volume	74
Issue number	8
DOIs	https://doi.org/10.1063/1.355308
State	Published - 1993
Externally published	Yes

ASJC Scopus subject areas

General Physics and Astronomy

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title = "Comment on {"}Steady-state temperature profile for a thin-film resistor under bias{"} [J. Appl. Phys. 72, 3862 (1992)]",

abstract = "This comment is to point out that the temperature dependence of the thermal conductivity should be taken into account in computing the temperature distribution in substrate material (such as silicon) with temperature-dependent thermal conductivity. Ignoring the temperature dependence of the thermal conductivity will lead to a large error in the calculated results.",

author = "Lu, {Yong Feng}",

year = "1993",

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N2 - This comment is to point out that the temperature dependence of the thermal conductivity should be taken into account in computing the temperature distribution in substrate material (such as silicon) with temperature-dependent thermal conductivity. Ignoring the temperature dependence of the thermal conductivity will lead to a large error in the calculated results.

AB - This comment is to point out that the temperature dependence of the thermal conductivity should be taken into account in computing the temperature distribution in substrate material (such as silicon) with temperature-dependent thermal conductivity. Ignoring the temperature dependence of the thermal conductivity will lead to a large error in the calculated results.

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Comment on "Steady-state temperature profile for a thin-film resistor under bias" [J. Appl. Phys. 72, 3862 (1992)]

Abstract

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