Abstract
The magnetic images of a magnetic reference sample using a point and a thin-film magnetic force microscopy were compared. The results clearly demonstrate that the volume of magnetic material involved in the tip-sample interaction is much reduced in the case of the point tip than that of the thin film tip. By comparing the magnetic images of a tri-bit pattern on a magnetic reference sample, an improved resolution using a point MFM tip was observed.
| Original language | English (US) |
|---|---|
| Title of host publication | Digests of the Intermag Conference |
| Publisher | IEEE |
| State | Published - 1999 |
| Event | Proceedings of the 1999 IEEE International Magnetics Conference 'Digest of Intermag 99' - Kyongju, South Korea Duration: May 18 1999 → May 21 1999 |
Other
| Other | Proceedings of the 1999 IEEE International Magnetics Conference 'Digest of Intermag 99' |
|---|---|
| City | Kyongju, South Korea |
| Period | 5/18/99 → 5/21/99 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
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Cite this
Liou, S. H. (1999). Comparison of magnetic images using point and thin-film magnetic force microscopy tips. In Digests of the Intermag Conference IEEE.