Abstract
The magnetic images of a magnetic reference sample using a point and a thin-film magnetic force microscopy were compared. The results clearly demonstrate that the volume of magnetic material involved in the tip-sample interaction is much reduced in the case of the point tip than that of the thin film tip. By comparing the magnetic images of a tri-bit pattern on a magnetic reference sample, an improved resolution using a point MFM tip was observed.
Original language | English (US) |
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Title of host publication | Digests of the Intermag Conference |
Publisher | IEEE |
State | Published - 1999 |
Event | Proceedings of the 1999 IEEE International Magnetics Conference 'Digest of Intermag 99' - Kyongju, South Korea Duration: May 18 1999 → May 21 1999 |
Other
Other | Proceedings of the 1999 IEEE International Magnetics Conference 'Digest of Intermag 99' |
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City | Kyongju, South Korea |
Period | 5/18/99 → 5/21/99 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering