Comparison of magnetic images using point and thin-film magnetic force microscopy tips

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The magnetic images of a magnetic reference sample using a point and a thin-film magnetic force microscopy were compared. The results clearly demonstrate that the volume of magnetic material involved in the tip-sample interaction is much reduced in the case of the point tip than that of the thin film tip. By comparing the magnetic images of a tri-bit pattern on a magnetic reference sample, an improved resolution using a point MFM tip was observed.

Original languageEnglish (US)
Title of host publicationDigests of the Intermag Conference
PublisherIEEE
StatePublished - 1999
EventProceedings of the 1999 IEEE International Magnetics Conference 'Digest of Intermag 99' - Kyongju, South Korea
Duration: May 18 1999May 21 1999

Other

OtherProceedings of the 1999 IEEE International Magnetics Conference 'Digest of Intermag 99'
CityKyongju, South Korea
Period5/18/995/21/99

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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