Contribution of double scattering in diffuse ultrasonic backscatter measurements

Ping Hu, Joseph A. Turner

Research output: Contribution to journalArticlepeer-review

25 Scopus citations


Diffuse ultrasonic backscatter measurements are used to describe the effective grain scattering present during high frequency ultrasonic inspections. Accurate modeling of the backscatter is important for both flaw detection and microstructural characterization. Previous models have been derived under the assumption of single scattering for which the ultrasound is assumed to scatter only once in the time between excitation and detection. This assumption has been shown to be valid in many experiments for which the time scales are short or the frequency is sufficiently low. However, there are also many instances (e.g., for strongly scattering materials, unfocused beams, or long propagation paths) for which the single scattering assumption appears to break down. In this article, a model for the double scatter is developed within the previous formalism based on Wigner distribution functions. The final expression allows the effect of double scattering to be estimated for any combination of experimental parameters. The improved proposed model is anticipated to increase the capabilities of ultrasonic microstructural evaluation, especially in terms of probability of detection estimates.

Original languageEnglish (US)
Pages (from-to)321-334
Number of pages14
JournalJournal of the Acoustical Society of America
Issue number1
StatePublished - Jan 1 2015

ASJC Scopus subject areas

  • Arts and Humanities (miscellaneous)
  • Acoustics and Ultrasonics


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