Coupling Spectroscopic Ellipsometry and Quartz Crystal Microbalance to Study Organic Films at the Solid-Liquid Interface

Ralf P. Richter, Keith B. Rodenhausen, Nico B. Eisele, Mathias Schubert

Research output: Chapter in Book/Report/Conference proceedingChapter

12 Scopus citations

Abstract

Spectroscopic ellipsometry (SE) and quartz crystal microbalance with dissipation monitoring (QCM-D) have become popular tools for the analysis of organic films, from a few Angstroms to a few micrometers in thickness, at the solid-liquid interface. Because of their different working principles, both techniques are highly complementary, providing insight into optical and mechanical properties, respectively. The combination of SE and QCM-D in one setup is not only attractive because this information becomes available at the same time on the same sample, but also because the correlation of SE and QCM-D responses can provide novel insight that is not accessible with either technique alone. Here, we discuss how the combined setup is implemented in practice and review current data analysis approaches that are useful with regard to the correlation of both methods. Particular attention is given to the novel insight that can be obtained by the combination of both techniques, such as the solvation, density and lateral organization of organic films.

Original languageEnglish (US)
Title of host publicationEllipsometry of Functional Organic Surfaces and Films
EditorsKarsten Hinrichs, Klaus-Jochen Eichhorn
Pages223-248
Number of pages26
DOIs
StatePublished - Jan 1 2014

Publication series

NameSpringer Series in Surface Sciences
Volume52
ISSN (Print)0931-5195

ASJC Scopus subject areas

  • Surfaces, Coatings and Films

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    Richter, R. P., Rodenhausen, K. B., Eisele, N. B., & Schubert, M. (2014). Coupling Spectroscopic Ellipsometry and Quartz Crystal Microbalance to Study Organic Films at the Solid-Liquid Interface. In K. Hinrichs, & K-J. Eichhorn (Eds.), Ellipsometry of Functional Organic Surfaces and Films (pp. 223-248). (Springer Series in Surface Sciences; Vol. 52). https://doi.org/10.1007/978-3-642-40128-2_11