TY - JOUR
T1 - Degradation of thin films in Low earth orbit and comparisons with laboratory simulation
AU - Spady, Blaine R.
AU - Synowicki, R. A.
AU - Hale, Jeffrey S.
AU - Devries, M. J.
AU - Ianno, N.
AU - McGahan, William A.
AU - Woollam, John A.
N1 - Funding Information:
This research was supported by grant NAG-3-95 from the NASA Lewis Research Center. The authors would like to extend a special thank you to Federico Sequenda, Suraiya Nafis, Rod Dillion, Hsuing Chen, and Tim Makovicka for the deposition of the various films flown on STS-46 and STS-51.
Funding Information:
This research was supported by grant NAG-3-95 from the NASA Lewis Research Center. The authors would like to extend a special thank you to Federico Sequenda, Suraiya Nafis, Rod Dillion, Hsuing Chen, and Tim Makovicka for the deposition of the various films flown on STS-46 and STS-5 1.
Publisher Copyright:
© 1994 SPIE. All rights reserved.
PY - 1994/11/4
Y1 - 1994/11/4
N2 - Low earth orbit exposes space materials simultaneously to atomic oxygen and ultraviolet light. Numerous materials were sputtered, e-beam evaporated, and CVD deposited. Experiments with these samples aboard the NASA (USA) 1992 and 1993 space flights STS-46 and STS-51 are discussed, and comparisons made with laboratory studies in an oxygen plasma environment. Multiple samples of thin films of Al, diamondlike carbon, diamond, silicon nitride, silicon carbide, and solar concentrator multilayer stacks were prepared. These were characterized both before and after flight by spectroscopic ellipsometry, spectrophotometry, interferometry, Auger spectroscopy, Raman spectroscopy, and atomic force microscopy.
AB - Low earth orbit exposes space materials simultaneously to atomic oxygen and ultraviolet light. Numerous materials were sputtered, e-beam evaporated, and CVD deposited. Experiments with these samples aboard the NASA (USA) 1992 and 1993 space flights STS-46 and STS-51 are discussed, and comparisons made with laboratory studies in an oxygen plasma environment. Multiple samples of thin films of Al, diamondlike carbon, diamond, silicon nitride, silicon carbide, and solar concentrator multilayer stacks were prepared. These were characterized both before and after flight by spectroscopic ellipsometry, spectrophotometry, interferometry, Auger spectroscopy, Raman spectroscopy, and atomic force microscopy.
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U2 - 10.1117/12.192089
DO - 10.1117/12.192089
M3 - Conference article
AN - SCOPUS:85076475855
SN - 0277-786X
VL - 2253
SP - 188
EP - 194
JO - Proceedings of SPIE - The International Society for Optical Engineering
JF - Proceedings of SPIE - The International Society for Optical Engineering
T2 - Optical Interference Coatings 1994
Y2 - 5 June 1994 through 10 June 1994
ER -