Effects of layer thickness on orientation distribution and magnetic properties of CoCrTa/Cr films

Z. S. Shan, H. Zeng, C. X. Zhu, M. Azarisooreh, K. Honardoost, Y. Liu, D. J. Sellmyer

Research output: Contribution to journalConference article

2 Scopus citations

Abstract

Two series of CoCrTa films, series A and series B, were prepared on NiP/Al substrate by dc magnetron sputtering. Series A had a Cr underlayer (CUT) thickness from 0 to 805 angstroms and CoCrTa magnetic layer thickness (CMLT) fixed at 300 angstroms; series B had CUT = 350 angstroms and CMLT varied from 46 to 823 angstroms. The orientation distribution of Co(110) crystal planes of the magnetic layer was studied by X-ray rocking curves to examine the evolution of the Co(110)/Cr(002) texture as a function of the Cr underlayer and the magnetic layer thickness, and the correlation between microstructure and magnetic properties of the thin film media. Both the intensity of the Co(110) planes and its angular distribution improved with increasing CUT and CMLT, especially in the thin layer region.

Original languageEnglish (US)
Pages (from-to)4310-4312
Number of pages3
JournalJournal of Applied Physics
Volume85
Issue number8 II A
StatePublished - Apr 15 1999
EventProceedings of the 43rd Annual Conference on Magnetism and Magnetic Materials - Miami, FL, USA
Duration: Nov 9 1998Nov 12 1998

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ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Shan, Z. S., Zeng, H., Zhu, C. X., Azarisooreh, M., Honardoost, K., Liu, Y., & Sellmyer, D. J. (1999). Effects of layer thickness on orientation distribution and magnetic properties of CoCrTa/Cr films. Journal of Applied Physics, 85(8 II A), 4310-4312.