Effects of layer thickness on orientation distribution and magnetic properties of CoCrTa/Cr films

Z. S. Shan; H. Zeng; C. X. Zhu; M. Azarisooreh; K. Honardoost; Y. Liu; D. J. Sellmyer

doi:10.1063/1.370352

Effects of layer thickness on orientation distribution and magnetic properties of CoCrTa/Cr films

Z. S. Shan, H. Zeng, C. X. Zhu, M. Azarisooreh, K. Honardoost, Y. Liu, D. J. Sellmyer

Research output: Contribution to journal › Conference article › peer-review

2 Scopus citations

Abstract

Two series of CoCrTa films, series A and series B, were prepared on NiP/Al substrate by dc magnetron sputtering. Series A had a Cr underlayer (CUT) thickness from 0 to 805 angstroms and CoCrTa magnetic layer thickness (CMLT) fixed at 300 angstroms; series B had CUT = 350 angstroms and CMLT varied from 46 to 823 angstroms. The orientation distribution of Co(110) crystal planes of the magnetic layer was studied by X-ray rocking curves to examine the evolution of the Co(110)/Cr(002) texture as a function of the Cr underlayer and the magnetic layer thickness, and the correlation between microstructure and magnetic properties of the thin film media. Both the intensity of the Co(110) planes and its angular distribution improved with increasing CUT and CMLT, especially in the thin layer region.

Original language	English (US)
Pages (from-to)	4310-4312
Number of pages	3
Journal	Journal of Applied Physics
Volume	85
Issue number	8 II A
DOIs	https://doi.org/10.1063/1.370352
State	Published - Apr 15 1999
Externally published	Yes
Event	Proceedings of the 43rd Annual Conference on Magnetism and Magnetic Materials - Miami, FL, USA Duration: Nov 9 1998 → Nov 12 1998

ASJC Scopus subject areas

Physics and Astronomy(all)

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10.1063/1.370352

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title = "Effects of layer thickness on orientation distribution and magnetic properties of CoCrTa/Cr films",

abstract = "Two series of CoCrTa films, series A and series B, were prepared on NiP/Al substrate by dc magnetron sputtering. Series A had a Cr underlayer (CUT) thickness from 0 to 805 angstroms and CoCrTa magnetic layer thickness (CMLT) fixed at 300 angstroms; series B had CUT = 350 angstroms and CMLT varied from 46 to 823 angstroms. The orientation distribution of Co(110) crystal planes of the magnetic layer was studied by X-ray rocking curves to examine the evolution of the Co(110)/Cr(002) texture as a function of the Cr underlayer and the magnetic layer thickness, and the correlation between microstructure and magnetic properties of the thin film media. Both the intensity of the Co(110) planes and its angular distribution improved with increasing CUT and CMLT, especially in the thin layer region.",

author = "Shan, {Z. S.} and H. Zeng and Zhu, {C. X.} and M. Azarisooreh and K. Honardoost and Y. Liu and Sellmyer, {D. J.}",

year = "1999",

month = apr,

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language = "English (US)",

volume = "85",

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journal = "Journal of Applied Physics",

issn = "0021-8979",

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number = "8 II A",

note = "Proceedings of the 43rd Annual Conference on Magnetism and Magnetic Materials ; Conference date: 09-11-1998 Through 12-11-1998",

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TY - JOUR

T1 - Effects of layer thickness on orientation distribution and magnetic properties of CoCrTa/Cr films

AU - Shan, Z. S.

AU - Zeng, H.

AU - Zhu, C. X.

AU - Azarisooreh, M.

AU - Honardoost, K.

AU - Liu, Y.

AU - Sellmyer, D. J.

PY - 1999/4/15

Y1 - 1999/4/15

N2 - Two series of CoCrTa films, series A and series B, were prepared on NiP/Al substrate by dc magnetron sputtering. Series A had a Cr underlayer (CUT) thickness from 0 to 805 angstroms and CoCrTa magnetic layer thickness (CMLT) fixed at 300 angstroms; series B had CUT = 350 angstroms and CMLT varied from 46 to 823 angstroms. The orientation distribution of Co(110) crystal planes of the magnetic layer was studied by X-ray rocking curves to examine the evolution of the Co(110)/Cr(002) texture as a function of the Cr underlayer and the magnetic layer thickness, and the correlation between microstructure and magnetic properties of the thin film media. Both the intensity of the Co(110) planes and its angular distribution improved with increasing CUT and CMLT, especially in the thin layer region.

AB - Two series of CoCrTa films, series A and series B, were prepared on NiP/Al substrate by dc magnetron sputtering. Series A had a Cr underlayer (CUT) thickness from 0 to 805 angstroms and CoCrTa magnetic layer thickness (CMLT) fixed at 300 angstroms; series B had CUT = 350 angstroms and CMLT varied from 46 to 823 angstroms. The orientation distribution of Co(110) crystal planes of the magnetic layer was studied by X-ray rocking curves to examine the evolution of the Co(110)/Cr(002) texture as a function of the Cr underlayer and the magnetic layer thickness, and the correlation between microstructure and magnetic properties of the thin film media. Both the intensity of the Co(110) planes and its angular distribution improved with increasing CUT and CMLT, especially in the thin layer region.

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DO - 10.1063/1.370352

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VL - 85

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EP - 4312

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 8 II A

T2 - Proceedings of the 43rd Annual Conference on Magnetism and Magnetic Materials

Y2 - 9 November 1998 through 12 November 1998

ER -

Effects of layer thickness on orientation distribution and magnetic properties of CoCrTa/Cr films

Abstract

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