A general model of the near field emission for a tip under polarized laser irradiation is established for the case of imaging and processing by a laser-assisted scanning probe microscope (SPM). The near field emission of an actual SPM tip was calculated using the method of moment. The tip-sample geometry was modelled as a cone approaching a surface at the tip apex. Laser-induced current modes in the tip and sample were established in the form of trigonometric functions. This model can be used for rigorous calculations and has been applied to investigate the dependence of the near field on laser wavelength, tip aspect ratios, tip-sample distance and the dielectric properties of both tip and sample.
|Original language||English (US)|
|Number of pages||6|
|Journal||Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers|
|State||Published - Oct 1999|
ASJC Scopus subject areas
- Physics and Astronomy(all)