Electron accumulation at nonpolar and semipolar surfaces of wurtzite InN from generalized infrared ellipsometry

V. Darakchieva; M. Schubert; T. Hofmann; B. Monemar; Ching Lien Hsiao; Ting Wei Liu; Li Chyong Chen; W. J. Schaff; Y. Takagi; Y. Nanishi

doi:10.1063/1.3261731

Electron accumulation at nonpolar and semipolar surfaces of wurtzite InN from generalized infrared ellipsometry

V. Darakchieva, M. Schubert, T. Hofmann, B. Monemar, Ching Lien Hsiao, Ting Wei Liu, Li Chyong Chen, W. J. Schaff, Y. Takagi, Y. Nanishi

Electrical & Computer Engineering

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Abstract

The free electron properties of nonpolar (11 2̄0) -oriented and semipolar (10 1̄1) -oriented wurtzite InN films are studied by generalized infrared ellipsometry (GIRSE). We demonstrate the sensitivity of GIRSE to the surface charge accumulation layer and find a distinct surface electron accumulation to occur at all surfaces. The obtained surface electron sheet densities are found to vary from 0.9× 10¹³ to 2.3× 10¹⁴ cm^-2 depending on the surface orientation and bulk electron concentration. The upper limits of the surface electron mobility parameters of 417-644 cm² /V s are determined and discussed in the light of electron confinement at the surface.

Original language	English (US)
Article number	202103
Journal	Applied Physics Letters
Volume	95
Issue number	20
DOIs	https://doi.org/10.1063/1.3261731
State	Published - 2009

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.3261731

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Electron accumulation at nonpolar and semipolar surfaces of wurtzite InN from generalized infrared ellipsometry. / Darakchieva, V.; Schubert, M.; Hofmann, T.; Monemar, B.; Hsiao, Ching Lien; Liu, Ting Wei; Chen, Li Chyong; Schaff, W. J.; Takagi, Y.; Nanishi, Y.

In: Applied Physics Letters, Vol. 95, No. 20, 202103, 2009.

Research output: Contribution to journal › Article › peer-review

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title = "Electron accumulation at nonpolar and semipolar surfaces of wurtzite InN from generalized infrared ellipsometry",

abstract = "The free electron properties of nonpolar (11 {\=2}0) -oriented and semipolar (10 {\=1}1) -oriented wurtzite InN films are studied by generalized infrared ellipsometry (GIRSE). We demonstrate the sensitivity of GIRSE to the surface charge accumulation layer and find a distinct surface electron accumulation to occur at all surfaces. The obtained surface electron sheet densities are found to vary from 0.9× 1013 to 2.3× 1014 cm-2 depending on the surface orientation and bulk electron concentration. The upper limits of the surface electron mobility parameters of 417-644 cm2 /V s are determined and discussed in the light of electron confinement at the surface.",

author = "V. Darakchieva and M. Schubert and T. Hofmann and B. Monemar and Hsiao, {Ching Lien} and Liu, {Ting Wei} and Chen, {Li Chyong} and Schaff, {W. J.} and Y. Takagi and Y. Nanishi",

note = "Funding Information: Financial support from FCT Portugal under Contract No. PTDC/FIS/100448/2008, program Ci{\^e}ncia 2007, and VR Sweden under Contract No. 2005-5054 is gratefully acknowledged.",

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volume = "95",

journal = "Applied Physics Letters",

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T1 - Electron accumulation at nonpolar and semipolar surfaces of wurtzite InN from generalized infrared ellipsometry

AU - Darakchieva, V.

AU - Schubert, M.

AU - Hofmann, T.

AU - Monemar, B.

AU - Hsiao, Ching Lien

AU - Liu, Ting Wei

AU - Chen, Li Chyong

AU - Schaff, W. J.

AU - Takagi, Y.

AU - Nanishi, Y.

N1 - Funding Information: Financial support from FCT Portugal under Contract No. PTDC/FIS/100448/2008, program Ciência 2007, and VR Sweden under Contract No. 2005-5054 is gratefully acknowledged.

PY - 2009

Y1 - 2009

N2 - The free electron properties of nonpolar (11 2̄0) -oriented and semipolar (10 1̄1) -oriented wurtzite InN films are studied by generalized infrared ellipsometry (GIRSE). We demonstrate the sensitivity of GIRSE to the surface charge accumulation layer and find a distinct surface electron accumulation to occur at all surfaces. The obtained surface electron sheet densities are found to vary from 0.9× 1013 to 2.3× 1014 cm-2 depending on the surface orientation and bulk electron concentration. The upper limits of the surface electron mobility parameters of 417-644 cm2 /V s are determined and discussed in the light of electron confinement at the surface.

AB - The free electron properties of nonpolar (11 2̄0) -oriented and semipolar (10 1̄1) -oriented wurtzite InN films are studied by generalized infrared ellipsometry (GIRSE). We demonstrate the sensitivity of GIRSE to the surface charge accumulation layer and find a distinct surface electron accumulation to occur at all surfaces. The obtained surface electron sheet densities are found to vary from 0.9× 1013 to 2.3× 1014 cm-2 depending on the surface orientation and bulk electron concentration. The upper limits of the surface electron mobility parameters of 417-644 cm2 /V s are determined and discussed in the light of electron confinement at the surface.

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SN - 0003-6951

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ER -

Electron accumulation at nonpolar and semipolar surfaces of wurtzite InN from generalized infrared ellipsometry

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