Electron accumulation at nonpolar and semipolar surfaces of wurtzite InN from generalized infrared ellipsometry

V. Darakchieva; M. Schubert; T. Hofmann; B. Monemar; Ching Lien Hsiao; Ting Wei Liu; Li Chyong Chen; W. J. Schaff; Y. Takagi; Y. Nanishi

doi:10.1063/1.3261731

Electron accumulation at nonpolar and semipolar surfaces of wurtzite InN from generalized infrared ellipsometry

V. Darakchieva, M. Schubert, T. Hofmann, B. Monemar, Ching Lien Hsiao, Ting Wei Liu, Li Chyong Chen, W. J. Schaff, Y. Takagi, Y. Nanishi

Electrical & Computer Engineering

Research output: Contribution to journal › Article

25 Scopus citations

Abstract

The free electron properties of nonpolar (11 2̄0) -oriented and semipolar (10 1̄1) -oriented wurtzite InN films are studied by generalized infrared ellipsometry (GIRSE). We demonstrate the sensitivity of GIRSE to the surface charge accumulation layer and find a distinct surface electron accumulation to occur at all surfaces. The obtained surface electron sheet densities are found to vary from 0.9× 10¹³ to 2.3× 10¹⁴ cm^-2 depending on the surface orientation and bulk electron concentration. The upper limits of the surface electron mobility parameters of 417-644 cm² /V s are determined and discussed in the light of electron confinement at the surface.

Original language	English (US)
Article number	202103
Journal	Applied Physics Letters
Volume	95
Issue number	20
DOIs	https://doi.org/10.1063/1.3261731
State	Published - Dec 1 2009

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.3261731

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Darakchieva, V., Schubert, M., Hofmann, T., Monemar, B., Hsiao, C. L., Liu, T. W., Chen, L. C., Schaff, W. J., Takagi, Y., & Nanishi, Y. (2009). Electron accumulation at nonpolar and semipolar surfaces of wurtzite InN from generalized infrared ellipsometry. Applied Physics Letters, 95(20), [202103]. https://doi.org/10.1063/1.3261731

Electron accumulation at nonpolar and semipolar surfaces of wurtzite InN from generalized infrared ellipsometry. / Darakchieva, V.; Schubert, M.; Hofmann, T.; Monemar, B.; Hsiao, Ching Lien; Liu, Ting Wei; Chen, Li Chyong; Schaff, W. J.; Takagi, Y.; Nanishi, Y.

In: Applied Physics Letters, Vol. 95, No. 20, 202103, 01.12.2009.

Research output: Contribution to journal › Article

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abstract = "The free electron properties of nonpolar (11 {\=2}0) -oriented and semipolar (10 {\=1}1) -oriented wurtzite InN films are studied by generalized infrared ellipsometry (GIRSE). We demonstrate the sensitivity of GIRSE to the surface charge accumulation layer and find a distinct surface electron accumulation to occur at all surfaces. The obtained surface electron sheet densities are found to vary from 0.9× 1013 to 2.3× 1014 cm-2 depending on the surface orientation and bulk electron concentration. The upper limits of the surface electron mobility parameters of 417-644 cm2 /V s are determined and discussed in the light of electron confinement at the surface.",

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AU - Darakchieva, V.

AU - Schubert, M.

AU - Hofmann, T.

AU - Monemar, B.

AU - Hsiao, Ching Lien

AU - Liu, Ting Wei

AU - Chen, Li Chyong

AU - Schaff, W. J.

AU - Takagi, Y.

AU - Nanishi, Y.

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AB - The free electron properties of nonpolar (11 2̄0) -oriented and semipolar (10 1̄1) -oriented wurtzite InN films are studied by generalized infrared ellipsometry (GIRSE). We demonstrate the sensitivity of GIRSE to the surface charge accumulation layer and find a distinct surface electron accumulation to occur at all surfaces. The obtained surface electron sheet densities are found to vary from 0.9× 1013 to 2.3× 1014 cm-2 depending on the surface orientation and bulk electron concentration. The upper limits of the surface electron mobility parameters of 417-644 cm2 /V s are determined and discussed in the light of electron confinement at the surface.

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