Electrooptic ellipsometry study of piezoelectric BaTiO3-ZnO heterostructures

V. M. Voora, T. Hofmann, M. Brandt, M. Lorenz, M. Grundmann, M. Schubert

Research output: Contribution to journalConference article

6 Scopus citations

Abstract

We report on electrooptic reflection-type spectroscopic ellipsometry investigations of a wurtzite structure (ZnO) and perovskite structure (BaTiO3) thin film heterostructure between Pt contacts. The ZnO spontaneous polarization biases the ferroelectric polarization domain switching in BaTiO3, and causes a strong asymmetric electrooptic hysteresis behavior, reflected by an overall change of sample effective thickness and effective index of refraction. This hysteresis behavior is concordant with our previously observed electric hysteresis behavior of the same sample structure.We explain the hysteresis behavior by piezoelectric strain within the ferroelectric layer, by interface lattice charge coupling between the BaTiO 3 and ZnO layer, and the previously identified depletion layer formation within the n-type doped ZnO layer. (Graph Presented) Asymmetric hysteresis loop of piezoelectric effective thickness d change δd/d in a thin film Pt-ZnO[0001-textured]-BaTiO3(111-textured)-Pt heterostructure.

Original languageEnglish (US)
Pages (from-to)1328-1331
Number of pages4
JournalPhysica Status Solidi (C) Current Topics in Solid State Physics
Volume5
Issue number5
DOIs
StatePublished - Dec 1 2008
Event4th International Conference on Spectroscopic Ellipsometry, ICSE4 - Stockholm, Sweden
Duration: Jun 11 2007Jun 15 2007

ASJC Scopus subject areas

  • Condensed Matter Physics

Fingerprint Dive into the research topics of 'Electrooptic ellipsometry study of piezoelectric BaTiO<sub>3</sub>-ZnO heterostructures'. Together they form a unique fingerprint.

  • Cite this