Abstract
The purpose of this study is to map the energy dissipation of Jurkat cells using a single 60 nanosecond pulse electric field (NsPEF), primarily through atomic force microscopy (AFM). The phase shift is generated by the sample elements that do not have a heterogeneous surface. Monitoring and manipulating the phase shift is a powerful way for determining the dissipated energy and plotting the topography. The dissipated energy is a relative value, so the silica wafer and cover slip are given a set reference while the transmission of energy between the tip of the cantilever and cell surfaces is measured. The most important finding is that the magnitude and the number of variations in the dissipated energy change with the strength of NsPEF applied. Utilizing a single low field strength NsPEF (15 kV/cm), minor changes in dissipated energy were found. The application of a single high field strength NsPEF (60 kV/cm) to Jurkat cells resulted in a higher dissipated energy change versus that of in the low field strength condition. Thus, the dissipated energy from the Jurkat cells changes with the strength of NsPEF. By analyzing the forces via investigation in the tapping mode of the AFM, the stabilization of the cytoskeleton and membrane of the cell are related to the strength of NsPEF applied. Furthermore, the strength of NsPEF indicates a meaningful relationship to the survival of the Jurkat cells.
Original language | English (US) |
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Pages (from-to) | 24-29 |
Number of pages | 6 |
Journal | Micron |
Volume | 105 |
DOIs | |
State | Published - Feb 2018 |
Keywords
- Atomic force microscopy
- Energy dissipation
- Jurkat cell
ASJC Scopus subject areas
- Structural Biology
- General Materials Science
- General Physics and Astronomy
- Cell Biology