Enhanced magneto-optic Kerr effects in thin magnetic/metallic layered structures

William A. McGahan; Liang Yao Chen; Z. S. Shan; D. J. Sellmyer; John A. Woollam

doi:10.1063/1.102004

Enhanced magneto-optic Kerr effects in thin magnetic/metallic layered structures

William A. McGahan, Liang Yao Chen, Z. S. Shan, D. J. Sellmyer, John A. Woollam

Research output: Contribution to journal › Article › peer-review

22 Scopus citations

Abstract

Enhanced Kerr rotation spectra are measured in thin magnetic layers on silver. Also, variable angle of incidence spectroscopic ellipsometry is employed to measure the optical dielectric function of both the thin magnetic layer and the underlying thick silver layer. These results are explained quantitatively using the electromagnetic theory for reflection of light from multiple layers of isotropic and gyrotropic materials.

Original language	English (US)
Pages (from-to)	2479-2481
Number of pages	3
Journal	Applied Physics Letters
Volume	55
Issue number	24
DOIs	https://doi.org/10.1063/1.102004
State	Published - 1989

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.102004

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@article{e027875d078442b28b82d750abb5090e,

title = "Enhanced magneto-optic Kerr effects in thin magnetic/metallic layered structures",

abstract = "Enhanced Kerr rotation spectra are measured in thin magnetic layers on silver. Also, variable angle of incidence spectroscopic ellipsometry is employed to measure the optical dielectric function of both the thin magnetic layer and the underlying thick silver layer. These results are explained quantitatively using the electromagnetic theory for reflection of light from multiple layers of isotropic and gyrotropic materials.",

author = "McGahan, {William A.} and Chen, {Liang Yao} and Shan, {Z. S.} and Sellmyer, {D. J.} and Woollam, {John A.}",

year = "1989",

doi = "10.1063/1.102004",

language = "English (US)",

volume = "55",

pages = "2479--2481",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "24",

}

TY - JOUR

T1 - Enhanced magneto-optic Kerr effects in thin magnetic/metallic layered structures

AU - McGahan, William A.

AU - Chen, Liang Yao

AU - Shan, Z. S.

AU - Sellmyer, D. J.

AU - Woollam, John A.

PY - 1989

Y1 - 1989

N2 - Enhanced Kerr rotation spectra are measured in thin magnetic layers on silver. Also, variable angle of incidence spectroscopic ellipsometry is employed to measure the optical dielectric function of both the thin magnetic layer and the underlying thick silver layer. These results are explained quantitatively using the electromagnetic theory for reflection of light from multiple layers of isotropic and gyrotropic materials.

AB - Enhanced Kerr rotation spectra are measured in thin magnetic layers on silver. Also, variable angle of incidence spectroscopic ellipsometry is employed to measure the optical dielectric function of both the thin magnetic layer and the underlying thick silver layer. These results are explained quantitatively using the electromagnetic theory for reflection of light from multiple layers of isotropic and gyrotropic materials.

UR - http://www.scopus.com/inward/record.url?scp=0007517767&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0007517767&partnerID=8YFLogxK

U2 - 10.1063/1.102004

DO - 10.1063/1.102004

M3 - Article

AN - SCOPUS:0007517767

SN - 0003-6951

VL - 55

SP - 2479

EP - 2481

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 24

ER -

Enhanced magneto-optic Kerr effects in thin magnetic/metallic layered structures

Abstract

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