Transmission electron microscopy of sputter deposited films of Tl2Ba2Ca2Cu3O10 on LaAlO3 show good film epitaxy and good film crystallinity at the film-substrate interface. Two samples, deposited under different sputtering conditions, yielded different critical current densities. The microstructure of the two samples is also very different.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Energy Engineering and Power Technology
- Electrical and Electronic Engineering