Ex situ variable angle spectroscopic ellipsometry studies of electron cyclotron resonance etching of Hg1-xCdxTe

Glennis J. Orloff, John A Woollam, Ping He, William A. Mcgahan, J. R. McNeil, R. D. Jacobson, Blaine Johs

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Fingerprint

Dive into the research topics of 'Ex situ variable angle spectroscopic ellipsometry studies of electron cyclotron resonance etching of Hg<sub>1-x</sub>Cd<sub>x</sub>Te'. Together they form a unique fingerprint.

Engineering & Materials Science

Physics & Astronomy

Chemical Compounds