Analytic expressions for the eigenvalues for the four–wave components at an oblique angle of light incidence inside a randomly oriented anisotropic magneto–optic dielectric medium are reported explicitly. In particular, these solutions are valid as long as the dielectric function tensor consists of a symmetric and an antisymmetric part. The normalized Jones reflection and transmission coefficients, i.e., the generalized ellipsometric parameters of homogeneously layered systems having nonsymmetric dielectric properties, are obtained immediately from a recently reviewed 4 × 4 matrix approach. Our explicit solutions allow a future analysis of the generalized ellipsometric data of multilayered magneto–optic media regardless of the orientation of the material magnetization and crystalline axes and the angle of light incidence. Possible experimental thin–film situations are discussed in terms of generalized ellipsometric parameters and illustrated for birefringent free-carrier effects in heavily doped semiconductor thin films and for oblique magnetization directions in magneto–optic multilayer systems.
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Engineering (miscellaneous)
- Electrical and Electronic Engineering