Abstract
We present a far-infrared (fir) spectroscopic ellipsometry study of the phonon properties of partially CuPtB-ordered (AlxGa 1-x)0.52In0.48P with x=0, 0.32, 0.7 and 1.0, and degrees of ordering η from 0 to 0.63, as obtained by generalized ellipsometry measurement of the near-band-gap order birefringence. An anharmonic oscillator approach is used to model the ordinary and extraordinary dielectric functions and determine the infrared-active longitudinal and transverse phonon modes of the thin-film samples. Besides the isotropic GaP-, InP- and AlP-like phonon modes, we observe alloy-induced modes with low polarity. The phonon modes of highly ordered (AlxGa1-x)0.52In 0.48P with η~0.6 are compared to phonon modes observed in the highly disordered quaternary solid solution. We propose measurement of the fir dielectric anisotropy as a sensitive indicator for existence of sublattice ordering in multicomponent group-III-group-V semiconductor alloys.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 601-604 |
| Number of pages | 4 |
| Journal | Thin Solid Films |
| Volume | 455-456 |
| DOIs | |
| State | Published - May 1 2004 |
| Externally published | Yes |
| Event | The 3rd International Conference on Spectroscopic Ellipsometry - Vienna, Austria Duration: Jul 6 2003 → Jul 11 2003 |
Keywords
- AlGaInP
- CuPt-ordering
- Far-infrared ellipsometry
- Phonon modes
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Metals and Alloys
- Materials Chemistry