FIB-TEM characterization of surface and sub-surface defects introduced into lithium niobate by a femtosecond laser

E. A. Stach, V. R. Radmilovic, D. Deshpande, A. Malshe, D. Alexander, D. Doerr

Research output: Contribution to journalArticle

1 Scopus citations
Original languageEnglish (US)
Pages (from-to)876-877
Number of pages2
JournalMicroscopy and Microanalysis
Volume9
Issue numberSUPPL. 2
StatePublished - Sep 4 2003

ASJC Scopus subject areas

  • Instrumentation

Cite this

Stach, E. A., Radmilovic, V. R., Deshpande, D., Malshe, A., Alexander, D., & Doerr, D. (2003). FIB-TEM characterization of surface and sub-surface defects introduced into lithium niobate by a femtosecond laser. Microscopy and Microanalysis, 9(SUPPL. 2), 876-877.