FIB-TEM characterization of surface and sub-surface defects introduced into lithium niobate by a femtosecond laser

E. A. Stach, V. R. Radmilovic, D. Deshpande, A. Malshe, D. Alexander, D. Doerr

Research output: Contribution to journalArticle

1 Scopus citations
Original languageEnglish (US)
Pages (from-to)876-877
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
StatePublished - 2003

ASJC Scopus subject areas

  • Instrumentation

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