Abstract
Lead-free piezoelectric thin films of composition (1-x)Bi0.5Na0.5TiO3-xBi0.5K0.5TiO3-0.03SrZrO3 (x = 15, 17.5, 20 and 22.5%) have been created using the sol-gel spin coating approach over a Pt/Ti/SiO2/Si substrate. The X-ray diffraction profiles suggest that a remarkable transition from tetragonal to rhombohedral-phase passing by a morphotropic phase boundary (MPB) occurs at x values from 17.5 to 22.5%. Additionally, the surface morphology, piezoelectric response, ferroelectric behavior, and energy storage properties were also investigated. Piezoresponse force microscopy (PFM) depicted a strong piezoelectric and ferroelectric behavior at a very localized size; at x = 17.5%. The piezoelectric behavior was enhanced and reached values of the recoverable energy storage density (Jrec) and the energy storage efficiency (η) of 3.27 J/cm3, and 39.9%, respectively. Such materials are anticipated to play an important role in lead-free devices.
Original language | English (US) |
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Pages (from-to) | 26061-26068 |
Number of pages | 8 |
Journal | Ceramics International |
Volume | 46 |
Issue number | 16 |
DOIs | |
State | Published - Nov 2020 |
Keywords
- BNT-BKT
- Energy storage
- Lead-free
- PFM
- Piezoelectric films
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Ceramics and Composites
- Process Chemistry and Technology
- Surfaces, Coatings and Films
- Materials Chemistry