Focused ion beam milled CoPt magnetic force microscopy tips for high resolution domain images

L. Gao, L. P. Yue, T. Yokota, R. Skomski, S. H. Liou, H. Takahoshi, H. Saito, S. Ishio

Research output: Contribution to journalArticlepeer-review

39 Scopus citations

Fingerprint

Dive into the research topics of 'Focused ion beam milled CoPt magnetic force microscopy tips for high resolution domain images'. Together they form a unique fingerprint.

Engineering & Materials Science

Chemical Compounds