Formation of CuIn_{1 - X}Al_xSe₂ thin films studied by Raman scattering

Engineering & Materials Science

• Raman scattering 100%
• Raman spectroscopy 92%
• Thin films 65%
• Inductively coupled plasma mass spectrometry 63%
• Phonons 54%
• X ray diffraction 33%
• Temperature 27%
• Aluminum 26%
• Chemical analysis 22%

Physics & Astronomy

• Raman spectroscopy 58%
• Raman spectra 53%
• inductively coupled plasma mass spectrometry 50%
• thin films 35%
• aluminum 23%
• phonons 23%
• products 22%
• room temperature 19%
• diffraction 18%
• x rays 15%
• temperature 10%

Chemical Compounds

• Phonon 77%
• Inductively Coupled Plasm Mass Spectrometry (ICPMS) 69%
• Raman Spectroscopy 52%
• Ambient Reaction Temperature 38%
• X-Ray Diffraction 34%
• Liquid Film 33%