Frequency shifts in crystal resonators due to intrinsic stresses in unequal thickness electrodes

Xiaomeng Yang, Jiashi Yang, John A. Kosinski, Joseph A. Turner

Research output: Contribution to conferencePaper

Abstract

We study frequency shifts in crystal resonators due to intrinsic stresses from electrodes with different thickness. The first-order perturbation integral as developed by Tiersten for frequency shifts in resonators is used. Frequency shifts in rotated Y-cut quartz thickness-shear resonators are calculated. The effect of asymmetric electrodes is examined.

Original languageEnglish (US)
Pages371-374
Number of pages4
StatePublished - 2005
Event2004 IEEE International Frequency Control Symposium and Exposition. A Conference of the IEEE Ultrasonics, Ferroelectrics, and Frequency Control Society (UFFC-S) - Montreal, Canada
Duration: Aug 23 2004Aug 27 2004

Conference

Conference2004 IEEE International Frequency Control Symposium and Exposition. A Conference of the IEEE Ultrasonics, Ferroelectrics, and Frequency Control Society (UFFC-S)
CountryCanada
CityMontreal
Period8/23/048/27/04

ASJC Scopus subject areas

  • Engineering(all)

Fingerprint Dive into the research topics of 'Frequency shifts in crystal resonators due to intrinsic stresses in unequal thickness electrodes'. Together they form a unique fingerprint.

Cite this