Abstract
Generalized spectroscopic ellipsometry is used to determine the form-induced birefringence and monoclinic optical constants of chromium columnar thin films. The slanted nanocolumns were deposited by glancing angle deposition under 85° incidence and are tilted from the surface normal. Dichroism measured for wavelengths from 400 to 1000 nm renders the Cr nanocolumns monoclinic absorbing crystals with c axis along the nanocolumns axis, b axis parallel to the film interface, and 74.8° monoclinic angle between a and c axes. The columnar thin film reveals anomalous optical dispersion, extreme birefringence, and strong dichroism and differs entirely from bulk chromium.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 992-994 |
| Number of pages | 3 |
| Journal | Optics Letters |
| Volume | 34 |
| Issue number | 7 |
| DOIs | |
| State | Published - Apr 1 2009 |
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
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Schmidt, D., Booso, B., Hofmann, T., Schubert, E., Sarangan, A., & Schubert, M. (2009). Generalized ellipsometry for monoclinic absorbing materials: determination of optical constants of Cr columnar thin films. Optics Letters, 34(7), 992-994. https://doi.org/10.1364/OL.34.000992