Abstract
Generalized ellipsometry allows complete extraction of the dielectric function tensor, including orientation, from measurement of skew-cut single crystal orthorhombic absorbing materials. As an example, Stibnite (Sb 2S3) is studied to determine fundamental phonon modes and band-to-band transitions, which are here provided for polarization along axes a, b, and c from lineshape analysis of the major dielectric function spectra.
Original language | English (US) |
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Pages (from-to) | 619-623 |
Number of pages | 5 |
Journal | Thin Solid Films |
Volume | 455-456 |
DOIs | |
State | Published - May 1 2004 |
Externally published | Yes |
Event | The 3rd International Conference on Spectroscopic Ellipsometry - Vienna, Austria Duration: Jul 6 2003 → Jul 11 2003 |
Keywords
- Anisotropy
- Band-to-band transitions
- Dielectric functions
- Generalized ellipsometry
- Phonon modes
- Stibnite
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Metals and Alloys
- Materials Chemistry