Abstract
We have successfully grown La 0.65Pb 0.35MnO 3 thin films by a RF magnetron sputtering method onto (100) LaAlO 3 single crystal substrates. X-ray diffraction measurements are consistent with a (100) cubic orientation of the films. The fourfold symmetry showed by LEED(Low Energy Electron Diffraction) patterns indicate that the films have surface order. STM(Scanning Tunneling Microscopy) measurements indicate that the surface of the films were smooth, with approximate 5 nm roughness. XPS (X-ray Photoemission Spectroscopy) shows that the surface defect density in the films is comparatively low. The bulk magnetization of the films at 6K in 1 T magnetic field reached 77 emu/g and a Curie temperature near 354 K, close to maximum resistivity. A negative magnetoresistance of 47% was observed at 320K in 5.5 T magnetic field.
Original language | English (US) |
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Title of host publication | Materials Research Society Symposium - Proceedings |
Editors | M.S. Rzchowski, M. Kawasaki, A.J. Millis, S. Molnar, M. Rajeswari |
Pages | 75-80 |
Number of pages | 6 |
Volume | 602 |
State | Published - 2000 |
Event | Magnetoresistive Oxides and Related Materials - Boston, MA, United States Duration: Nov 29 1999 → Dec 2 1999 |
Other
Other | Magnetoresistive Oxides and Related Materials |
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Country/Territory | United States |
City | Boston, MA |
Period | 11/29/99 → 12/2/99 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials