High resolution electron microscopy and nano-probe study of CoSm // Cr films

Y. Liu, D. J. Sellmyer, B. W. Robertson, Z. S. Shan, S. H. Liou, Y. Liu, B. W. Robertson, D. J. Sellmyer, Z. S. Shan, S. H. Liou

Research output: Contribution to journalArticle

27 Scopus citations

Abstract

The crystal structure of the crystallites in CoSm thin films deposited on Cr underlayer was studied by nanodiffraction and high resolution electron microscopy (HREM). It was found that the crystallites have a closed-packed structure. Some nanodiffraction patterns taken from different crystallites using a two nanometer probe can be indexed by two layer stacking AB (HCP structure), three layer stacking ABC (FCC structure), and four layer stacking ABAC (double hexagonal structure), suggesting that a particular local stacking mode could exist. [112̄0] HREM images confirmed that the stacking sequence changes within one crystallite. In local regions, random stacking, and unit cells of two layer stacking AB, three layer stacking ABC, and four layer stacking ABAC were found.

Original languageEnglish (US)
Pages (from-to)2740-2742
Number of pages3
JournalIEEE Transactions on Magnetics
Volume31
Issue number6
DOIs
StatePublished - Nov 1995

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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    Liu, Y., Sellmyer, D. J., Robertson, B. W., Shan, Z. S., Liou, S. H., Liu, Y., Robertson, B. W., Sellmyer, D. J., Shan, Z. S., & Liou, S. H. (1995). High resolution electron microscopy and nano-probe study of CoSm // Cr films. IEEE Transactions on Magnetics, 31(6), 2740-2742. https://doi.org/10.1109/20.490109