High-resolution radiography of thick steel objects using an all-laser-driven MeV-energy x-ray source

Daniel Haden, Shouyuan Chen, Baozhen Zhao, Ping Zhang, Grigory Golovin, Wenchao Yan, Colton Fruhling, Sudeep Banerjee, Donald Umstadter

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The recent development of a high-brightness MeV-photon source based on inverse-Compton scattering (ICS) has opened up exciting new possibilities for high-resolution radiography of dense objects. The x-ray beam is extremely bright, micron-source size, with mrad divergence, and high-spectral density, which makes it ideal for studies where high-resolution is required. The x-ray source is tunable over a wide range of parameters and we will discuss how the adjustable source parameters affect both transverse and longitudinal resolution. We then present results on the radiography of a thick steel object using this ICS source, and demonstrate the capabilities of this source with respect to operation at high photon energy while providing high spatial resolution.

Original languageEnglish (US)
Title of host publicationAdvances in Laboratory-Based X-Ray Sources, Optics, and Applications V
EditorsGert E. van Dorssen, Ali M. Khounsary
PublisherSPIE
ISBN (Electronic)9781510603196
DOIs
StatePublished - 2016
EventAdvances in Laboratory-Based X-Ray Sources, Optics, and Applications V - San Diego, United States
Duration: Aug 30 2016Aug 31 2016

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9964
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherAdvances in Laboratory-Based X-Ray Sources, Optics, and Applications V
CountryUnited States
CitySan Diego
Period8/30/168/31/16

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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