Hole mobilities in a photorefractive polymer

Arosha W. Goonesekera, Stephen Ducharme, James M. Takacs, Lei Zhang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

We present measurements of the hole mobility in a photorefractive polymer composite as a function of temperature and applied electric field. The material is a composite, non-linear optical polymer bisphenol A 4-4'- nitroaminostilbene (bisA-NAS) mixed with 30 wt % of the hole transport agent diethylamino-benzaldehyde diphenyl hydrazone (DEH). The electric field and temperature dependencies of the hole mobility in the photorefractive polymer can be described at high fields by exp(βE 1/2 ) and exp [-(T 0/T) 2] respectively, in agreement with the disorder theory of the well-known hopping model developed for charge-transport in molecularly doped polymers. The mobilities at all temperatures decrease (β less than 0) with increasing fields up to a certain field, but increase again (β greater than 0) at higher fields.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsStephen Ducharme, James W. Stasiak
Pages41-52
Number of pages12
StatePublished - 1996
EventOrganic Photorefractive Materials and Xerographic Photoreceptors - Denver, CO, USA
Duration: Aug 7 1996Aug 8 1996

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2850
ISSN (Print)0277-786X

Other

OtherOrganic Photorefractive Materials and Xerographic Photoreceptors
CityDenver, CO, USA
Period8/7/968/8/96

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Goonesekera, A. W., Ducharme, S., Takacs, J. M., & Zhang, L. (1996). Hole mobilities in a photorefractive polymer. In S. Ducharme, & J. W. Stasiak (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (pp. 41-52). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 2850).