Image contrast enhancement in field-emission scanning electron microscopy of single-walled carbon nanotubes

Y. S. Zhou; K. J. Yi; M. Mahjouri-Samani; W. Xiong; Y. F. Lu; S. H. Liou

doi:10.1016/j.apsusc.2008.11.035

Image contrast enhancement in field-emission scanning electron microscopy of single-walled carbon nanotubes

Y. S. Zhou, K. J. Yi, M. Mahjouri-Samani, W. Xiong, Y. F. Lu, S. H. Liou

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

The image contrast enhancement in scanning electron microscopy of single-walled carbon nanotubes (SWNTs) on SiO ₂ surfaces was experimentally investigated using a field-emission scanning electron microscope (FESEM) using a wide range of primary electron (PE) voltages. SWNT images of different contrasts were obtained at different PE voltages. Image contrast enhancement of SWNTs was investigated by charging SiO ₂ surfaces at different PE voltages. The phenomena are ascribed to the surface potential difference and charge injection between SWNTs and SiO ₂ substrates induced by the electron-beam irradiation.

Original language	English (US)
Pages (from-to)	4341-4346
Number of pages	6
Journal	Applied Surface Science
Volume	255
Issue number	7
DOIs	https://doi.org/10.1016/j.apsusc.2008.11.035
State	Published - Jan 15 2009

Keywords

Field-emission scanning electron microscopy
Single-walled carbon nanotubes

ASJC Scopus subject areas

Chemistry(all)
Condensed Matter Physics
Physics and Astronomy(all)
Surfaces and Interfaces
Surfaces, Coatings and Films

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10.1016/j.apsusc.2008.11.035

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title = "Image contrast enhancement in field-emission scanning electron microscopy of single-walled carbon nanotubes",

abstract = " The image contrast enhancement in scanning electron microscopy of single-walled carbon nanotubes (SWNTs) on SiO 2 surfaces was experimentally investigated using a field-emission scanning electron microscope (FESEM) using a wide range of primary electron (PE) voltages. SWNT images of different contrasts were obtained at different PE voltages. Image contrast enhancement of SWNTs was investigated by charging SiO 2 surfaces at different PE voltages. The phenomena are ascribed to the surface potential difference and charge injection between SWNTs and SiO 2 substrates induced by the electron-beam irradiation.",

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AU - Zhou, Y. S.

AU - Yi, K. J.

AU - Mahjouri-Samani, M.

AU - Xiong, W.

AU - Lu, Y. F.

AU - Liou, S. H.

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AB - The image contrast enhancement in scanning electron microscopy of single-walled carbon nanotubes (SWNTs) on SiO 2 surfaces was experimentally investigated using a field-emission scanning electron microscope (FESEM) using a wide range of primary electron (PE) voltages. SWNT images of different contrasts were obtained at different PE voltages. Image contrast enhancement of SWNTs was investigated by charging SiO 2 surfaces at different PE voltages. The phenomena are ascribed to the surface potential difference and charge injection between SWNTs and SiO 2 substrates induced by the electron-beam irradiation.

KW - Field-emission scanning electron microscopy

KW - Single-walled carbon nanotubes

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