Image contrast enhancement in field-emission scanning electron microscopy of single-walled carbon nanotubes

Y. S. Zhou; K. J. Yi; M. Mahjouri-Samani; W. Xiong; Y. F. Lu; S. H. Liou

doi:10.1016/j.apsusc.2008.11.035

Image contrast enhancement in field-emission scanning electron microscopy of single-walled carbon nanotubes

Y. S. Zhou, K. J. Yi, M. Mahjouri-Samani, W. Xiong, Y. F. Lu, S. H. Liou

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

The image contrast enhancement in scanning electron microscopy of single-walled carbon nanotubes (SWNTs) on SiO ₂ surfaces was experimentally investigated using a field-emission scanning electron microscope (FESEM) using a wide range of primary electron (PE) voltages. SWNT images of different contrasts were obtained at different PE voltages. Image contrast enhancement of SWNTs was investigated by charging SiO ₂ surfaces at different PE voltages. The phenomena are ascribed to the surface potential difference and charge injection between SWNTs and SiO ₂ substrates induced by the electron-beam irradiation.

Original language	English (US)
Pages (from-to)	4341-4346
Number of pages	6
Journal	Applied Surface Science
Volume	255
Issue number	7
DOIs	https://doi.org/10.1016/j.apsusc.2008.11.035
State	Published - Jan 15 2009

Keywords

Field-emission scanning electron microscopy
Single-walled carbon nanotubes

ASJC Scopus subject areas

General Chemistry
Condensed Matter Physics
General Physics and Astronomy
Surfaces and Interfaces
Surfaces, Coatings and Films

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10.1016/j.apsusc.2008.11.035

Cite this

@article{244a7ed4360f495797347c8e38db095d,

title = "Image contrast enhancement in field-emission scanning electron microscopy of single-walled carbon nanotubes",

abstract = " The image contrast enhancement in scanning electron microscopy of single-walled carbon nanotubes (SWNTs) on SiO 2 surfaces was experimentally investigated using a field-emission scanning electron microscope (FESEM) using a wide range of primary electron (PE) voltages. SWNT images of different contrasts were obtained at different PE voltages. Image contrast enhancement of SWNTs was investigated by charging SiO 2 surfaces at different PE voltages. The phenomena are ascribed to the surface potential difference and charge injection between SWNTs and SiO 2 substrates induced by the electron-beam irradiation.",

keywords = "Field-emission scanning electron microscopy, Single-walled carbon nanotubes",

author = "Zhou, {Y. S.} and Yi, {K. J.} and M. Mahjouri-Samani and W. Xiong and Lu, {Y. F.} and Liou, {S. H.}",

note = "Funding Information: The authors would like to thank National Science Foundation and Nebraska Research Initiative for financially supporting this research. The authors would also like to thank Drs. N.J. Ianno and Y. Zhou for their technical support and valuable discussion during this research.",

year = "2009",

month = jan,

day = "15",

doi = "10.1016/j.apsusc.2008.11.035",

language = "English (US)",

volume = "255",

pages = "4341--4346",

journal = "Applied Surface Science",

issn = "0169-4332",

publisher = "Elsevier B.V.",

number = "7",

}

TY - JOUR

T1 - Image contrast enhancement in field-emission scanning electron microscopy of single-walled carbon nanotubes

AU - Zhou, Y. S.

AU - Yi, K. J.

AU - Mahjouri-Samani, M.

AU - Xiong, W.

AU - Lu, Y. F.

AU - Liou, S. H.

N1 - Funding Information: The authors would like to thank National Science Foundation and Nebraska Research Initiative for financially supporting this research. The authors would also like to thank Drs. N.J. Ianno and Y. Zhou for their technical support and valuable discussion during this research.

PY - 2009/1/15

Y1 - 2009/1/15

N2 - The image contrast enhancement in scanning electron microscopy of single-walled carbon nanotubes (SWNTs) on SiO 2 surfaces was experimentally investigated using a field-emission scanning electron microscope (FESEM) using a wide range of primary electron (PE) voltages. SWNT images of different contrasts were obtained at different PE voltages. Image contrast enhancement of SWNTs was investigated by charging SiO 2 surfaces at different PE voltages. The phenomena are ascribed to the surface potential difference and charge injection between SWNTs and SiO 2 substrates induced by the electron-beam irradiation.

AB - The image contrast enhancement in scanning electron microscopy of single-walled carbon nanotubes (SWNTs) on SiO 2 surfaces was experimentally investigated using a field-emission scanning electron microscope (FESEM) using a wide range of primary electron (PE) voltages. SWNT images of different contrasts were obtained at different PE voltages. Image contrast enhancement of SWNTs was investigated by charging SiO 2 surfaces at different PE voltages. The phenomena are ascribed to the surface potential difference and charge injection between SWNTs and SiO 2 substrates induced by the electron-beam irradiation.

KW - Field-emission scanning electron microscopy

KW - Single-walled carbon nanotubes

UR - http://www.scopus.com/inward/record.url?scp=58149092116&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=58149092116&partnerID=8YFLogxK

U2 - 10.1016/j.apsusc.2008.11.035

DO - 10.1016/j.apsusc.2008.11.035

M3 - Article

AN - SCOPUS:58149092116

SN - 0169-4332

VL - 255

SP - 4341

EP - 4346

JO - Applied Surface Science

JF - Applied Surface Science

IS - 7

ER -

Image contrast enhancement in field-emission scanning electron microscopy of single-walled carbon nanotubes

Abstract

Keywords

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