Abstract
The image contrast enhancement in scanning electron microscopy of single-walled carbon nanotubes (SWNTs) on SiO 2 surfaces was experimentally investigated using a field-emission scanning electron microscope (FESEM) using a wide range of primary electron (PE) voltages. SWNT images of different contrasts were obtained at different PE voltages. Image contrast enhancement of SWNTs was investigated by charging SiO 2 surfaces at different PE voltages. The phenomena are ascribed to the surface potential difference and charge injection between SWNTs and SiO 2 substrates induced by the electron-beam irradiation.
Original language | English (US) |
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Pages (from-to) | 4341-4346 |
Number of pages | 6 |
Journal | Applied Surface Science |
Volume | 255 |
Issue number | 7 |
DOIs | |
State | Published - Jan 15 2009 |
Keywords
- Field-emission scanning electron microscopy
- Single-walled carbon nanotubes
ASJC Scopus subject areas
- General Chemistry
- Condensed Matter Physics
- General Physics and Astronomy
- Surfaces and Interfaces
- Surfaces, Coatings and Films