The image contrast enhancement in scanning electron microscopy of single-walled carbon nanotubes (SWNTs) on SiO 2 surfaces was experimentally investigated using a field-emission scanning electron microscope (FESEM) using a wide range of primary electron (PE) voltages. SWNT images of different contrasts were obtained at different PE voltages. Image contrast enhancement of SWNTs was investigated by charging SiO 2 surfaces at different PE voltages. The phenomena are ascribed to the surface potential difference and charge injection between SWNTs and SiO 2 substrates induced by the electron-beam irradiation.
- Field-emission scanning electron microscopy
- Single-walled carbon nanotubes
ASJC Scopus subject areas
- Condensed Matter Physics
- Physics and Astronomy(all)
- Surfaces and Interfaces
- Surfaces, Coatings and Films