Imaging using lateral bending modes of atomic force microscope cantilevers

A. Caron, U. Rabe, M. Reinstädtler, J. A. Turner, W. Arnold

Research output: Contribution to journalArticlepeer-review

21 Scopus citations


Using scanning probe techniques, surface properties such as shear stiffness and friction can be measured with a resolution in the nanometer range. The torsional deflection or buckling of atomic force microscope cantilevers has previously been used in order to measure the lateral forces acting on the tip. This letter shows that the flexural vibration modes of cantilevers oscillating in their width direction parallel to the sample surface can also be used for imaging. These lateral cantilever modes exhibit vertical deflection amplitudes if the cantilever is asymmetric in thickness direction, e.g., by a trapezoidal cross section.

Original languageEnglish (US)
Pages (from-to)6398-6400
Number of pages3
JournalApplied Physics Letters
Issue number26
StatePublished - Dec 27 2004
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)


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