@article{4880620ef6404f95a54c8cc199e645fb,
title = "Imaging using lateral bending modes of atomic force microscope cantilevers",
abstract = "Using scanning probe techniques, surface properties such as shear stiffness and friction can be measured with a resolution in the nanometer range. The torsional deflection or buckling of atomic force microscope cantilevers has previously been used in order to measure the lateral forces acting on the tip. This letter shows that the flexural vibration modes of cantilevers oscillating in their width direction parallel to the sample surface can also be used for imaging. These lateral cantilever modes exhibit vertical deflection amplitudes if the cantilever is asymmetric in thickness direction, e.g., by a trapezoidal cross section.",
author = "A. Caron and U. Rabe and M. Reinst{\"a}dtler and Turner, {J. A.} and W. Arnold",
note = "Funding Information: The authors are thankful for grants from the German Ministry of Education, Science and Technology, the German Science Foundation within the Materials Science Graduate College at the University of the Saarland. J.A.T. is supported by the National Science Foundation (Grant Nos. DMI-0210850, INT-0089548). The authors also thank the German Academic Exchange Service for supporting the collaboration between UNL and the IZFP. It is a pleasure to thank C. Deutscher, U. Eberlein, and K. Reinst{\"a}dtler for skillful measurements of the oscillatory behavior of the cantilevers using optical interferometry. J. R{\"o}del from the Technical University of Darmstadt is acknowledged for collaboration on the fracture mechanics of polycrystalline yttrium stabilized zirconia and for fruitful discussions.",
year = "2004",
month = dec,
day = "27",
doi = "10.1063/1.1833553",
language = "English (US)",
volume = "85",
pages = "6398--6400",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics Publising LLC",
number = "26",
}