Improvement of Radiation Hardness in Fully-Depleted SOI N MOSFETs Using Geimplantation

H. Wei, James E. Chung, Nader M. Kalkhoran, Fereydoon Namavar, N. K. Annamalai, Walter M. Shedd

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

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