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In situ infrared and visible-light ellipsometric investigations of boron nitride thin films at elevated temperatures
E. Franke, M. Schubert, J. D. Hecht, H. Neumann, T. E. Tiwald, D. W. Thompson, H. Yao, J. A. Woollam, J. Hahn
Research output: Contribution to journal › Article › peer-review
16
Scopus
citations