Infrared behavior of aluminum nanostructure sculptured thin films

T. Hofmann, M. Schubert, D. Schmidt, E. Schubert

Research output: Chapter in Book/Report/Conference proceedingConference contribution


We report on fabrication, structural and infrared optical characterization of nanostructure aluminum sculptured thin films prepared by glancing angle deposition (GLAD) and controlled substrate motion on p-type silicon. We discuss two structures, one with plate-like and one with screw-like (chiral) morphology. While the plate-like sample possesses a metal Drude behavior in the infrared spectral range, the chiral nanowire sample behaves non-metallic and reveals a series of intriguing resonances, which are equally spaced in frequency by ∼7.5 THz. We suggest that formation of 3D nano resonator circuits consisting of inductances and capacitances has occurred within the screw-like conductive aluminum wire sample, which might be responsible for the observed resonances. We suggest conductive GLAD nanostructures in combination with Schottky diodes to facilitate active or passive THz detector and transmitter devices.

Original languageEnglish (US)
Title of host publicationMaterials Research Society Symposium Proceedings - Semiconductor Nanowires-Growth, Physics, Devices and Applications
PublisherMaterials Research Society
Number of pages6
ISBN (Print)9781605609720
StatePublished - 2008
EventSemiconductor Nanowires-Growth, Physics, Devices and Applications - San Francisco, CA, United States
Duration: Mar 24 2008Mar 28 2008

Publication series

NameMaterials Research Society Symposium Proceedings
ISSN (Print)0272-9172


OtherSemiconductor Nanowires-Growth, Physics, Devices and Applications
Country/TerritoryUnited States
CitySan Francisco, CA

ASJC Scopus subject areas

  • General Materials Science
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering


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