Infrared dielectric function and phonon modes of Mg-rich cubic Mg xZn1-xO (x≥0.67) thin films on sapphire (0001)

C. Bundesmann; M. Schubert; A. Rahm; D. Spemann; H. Hochmuth; M. Lorenz; M. Grundmann

doi:10.1063/1.1777797

Infrared dielectric function and phonon modes of Mg-rich cubic Mg _xZn_1-xO (x≥0.67) thin films on sapphire (0001)

C. Bundesmann, M. Schubert, A. Rahm, D. Spemann, H. Hochmuth, M. Lorenz, M. Grundmann

Research output: Contribution to journal › Article › peer-review

34 Scopus citations

Abstract

Infrared spectroscopic ellipsometry (IRSE) was used for investigating pulse laser deposition (PLD)-grown single-phase cubic Mg_xZn_1-xO thin films. The phonon mode frequencies, their broadening parameters, and the high-frequency line parameter of the dielectric function in the dependence on Mg content were extracted by model line shape analysis. All the parameters demonstrated a systematic variation with x. A decreasing lattice constant was revealed by x-ray diffraction (XRD) analysis.

Original language	English (US)
Pages (from-to)	905-907
Number of pages	3
Journal	Applied Physics Letters
Volume	85
Issue number	6
DOIs	https://doi.org/10.1063/1.1777797
State	Published - Aug 9 2004
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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title = "Infrared dielectric function and phonon modes of Mg-rich cubic Mg xZn1-xO (x≥0.67) thin films on sapphire (0001)",

abstract = "Infrared spectroscopic ellipsometry (IRSE) was used for investigating pulse laser deposition (PLD)-grown single-phase cubic MgxZn1-xO thin films. The phonon mode frequencies, their broadening parameters, and the high-frequency line parameter of the dielectric function in the dependence on Mg content were extracted by model line shape analysis. All the parameters demonstrated a systematic variation with x. A decreasing lattice constant was revealed by x-ray diffraction (XRD) analysis.",

author = "C. Bundesmann and M. Schubert and A. Rahm and D. Spemann and H. Hochmuth and M. Lorenz and M. Grundmann",

note = "Funding Information: This work was supported by the Bundesministerium f{\"u}r Bildung und Forschung (FK 03WKI09) and the Deutsche Forschungsgemeinschaft within the framework of FOR 404 (Gr 1011/14-1).",

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T1 - Infrared dielectric function and phonon modes of Mg-rich cubic Mg xZn1-xO (x≥0.67) thin films on sapphire (0001)

AU - Bundesmann, C.

AU - Schubert, M.

AU - Rahm, A.

AU - Spemann, D.

AU - Hochmuth, H.

AU - Lorenz, M.

AU - Grundmann, M.

N1 - Funding Information: This work was supported by the Bundesministerium für Bildung und Forschung (FK 03WKI09) and the Deutsche Forschungsgemeinschaft within the framework of FOR 404 (Gr 1011/14-1).

PY - 2004/8/9

Y1 - 2004/8/9

N2 - Infrared spectroscopic ellipsometry (IRSE) was used for investigating pulse laser deposition (PLD)-grown single-phase cubic MgxZn1-xO thin films. The phonon mode frequencies, their broadening parameters, and the high-frequency line parameter of the dielectric function in the dependence on Mg content were extracted by model line shape analysis. All the parameters demonstrated a systematic variation with x. A decreasing lattice constant was revealed by x-ray diffraction (XRD) analysis.

AB - Infrared spectroscopic ellipsometry (IRSE) was used for investigating pulse laser deposition (PLD)-grown single-phase cubic MgxZn1-xO thin films. The phonon mode frequencies, their broadening parameters, and the high-frequency line parameter of the dielectric function in the dependence on Mg content were extracted by model line shape analysis. All the parameters demonstrated a systematic variation with x. A decreasing lattice constant was revealed by x-ray diffraction (XRD) analysis.

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Infrared dielectric function and phonon modes of Mg-rich cubic Mg _xZn_1-xO (x≥0.67) thin films on sapphire (0001)

Abstract

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