Abstract
Infrared dielectric function spectra and phonon modes with polarization parallel and perpendicular to the c axis of high quality, highly relaxed, and single crystalline wurtzite MgxZn1-xO films with 0≤x≤0.2 prepared by pulsed-laser deposition on c-plane sapphire substrates were obtained from infrared spectroscopic ellipsometry (380-1200cm -1) and Raman scattering studies. A two-mode behavior is found for the modes with E1 symmetry, a lattice mode and an impurity-type mode are obtained for the A1 symmetry phonons. Model dielectric function spectra will become useful for future infrared ellipsometry analysis of complex MgxZn1-xO-based heterostructures.
Original language | English (US) |
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Pages (from-to) | 2376-2378 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 81 |
Issue number | 13 |
DOIs | |
State | Published - Sep 23 2002 |
Externally published | Yes |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)