Infrared ellipsometric characterization of silicon nitride films on textured Si photovoltaic cells

M. F. Saenger, M. Schädel, T. Hofmann, J. Hilfiker, J. Sun, T. Tiwald, M. Schubert, J. A. Woollam

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

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