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Infrared ellipsometric characterization of silicon nitride films on textured Si photovoltaic cells
M. F. Saenger, M. Schädel, T. Hofmann, J. Hilfiker, J. Sun, T. Tiwald, M. Schubert, J. A. Woollam
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
1
Scopus
citations