Infrared ellipsometry and near-infrared-to-vacuum-ultraviolet ellipsometry study of free-charge carrier properties in In-polar p-type InN

Stefan Schöche, Tino Hofmann, Nebiha Ben Sedrine, Vanya Darakchieva, Xinqiang Wang, Akihiko Yoshikawa, Mathias Schubert

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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