Infrared ellipsometry characterization of conducting thin organic films

M. Schubert; C. Bundesmann; G. Jakopic; H. Maresch; H. Arwin; N. C. Persson; F. Zhang; O. Inganäs

doi:10.1016/j.tsf.2003.11.194

Infrared ellipsometry characterization of conducting thin organic films

M. Schubert, C. Bundesmann, G. Jakopic, H. Maresch, H. Arwin, N. C. Persson, F. Zhang, O. Inganäs

Research output: Contribution to journal › Conference article › peer-review

23 Scopus citations

Abstract

Infrared spectroscopic ellipsometry for wave numbers from 333 to 4000 cm^-1 is demonstrated as a useful technique for characterization of structural, vibrational, and free-charge-carrier properties of conducting organic thin layers deposited on electrically conducting as well as on isolating substrates. Pentacene and poly(3,4-ethylenedioxy thiophene)/ poly(styrenesulfonate) (PEDOT:PSS) are studied exemplarily. For both materials, the infrared dielectric functions are reported, which can serve as fingerprints for multiple-layer structures analysis. PEDOT:PSS layers deposited onto n-type and p-type silicon substrates reveal different conductivity response, whereas the IRSE data show that the pentacene layers on glass are rendered highly resistive.

Original language	English (US)
Pages (from-to)	295-300
Number of pages	6
Journal	Thin Solid Films
Volume	455-456
DOIs	https://doi.org/10.1016/j.tsf.2003.11.194
State	Published - May 1 2004
Externally published	Yes
Event	The 3rd International Conference on Spectroscopic Ellipsometry - Vienna, Austria Duration: Jul 6 2003 → Jul 11 2003

Keywords

Anisotropy
Conducting polymers
Ellipsometry
Infrared spectroscopic ellipsometry (IRSE)
Pentacene

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Surfaces and Interfaces
Surfaces, Coatings and Films
Metals and Alloys
Materials Chemistry

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10.1016/j.tsf.2003.11.194

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@article{8b48e13609484df4b178c3c7785c5c64,

title = "Infrared ellipsometry characterization of conducting thin organic films",

abstract = "Infrared spectroscopic ellipsometry for wave numbers from 333 to 4000 cm-1 is demonstrated as a useful technique for characterization of structural, vibrational, and free-charge-carrier properties of conducting organic thin layers deposited on electrically conducting as well as on isolating substrates. Pentacene and poly(3,4-ethylenedioxy thiophene)/ poly(styrenesulfonate) (PEDOT:PSS) are studied exemplarily. For both materials, the infrared dielectric functions are reported, which can serve as fingerprints for multiple-layer structures analysis. PEDOT:PSS layers deposited onto n-type and p-type silicon substrates reveal different conductivity response, whereas the IRSE data show that the pentacene layers on glass are rendered highly resistive.",

keywords = "Anisotropy, Conducting polymers, Ellipsometry, Infrared spectroscopic ellipsometry (IRSE), Pentacene",

author = "M. Schubert and C. Bundesmann and G. Jakopic and H. Maresch and H. Arwin and Persson, {N. C.} and F. Zhang and O. Ingan{\"a}s",

note = "Funding Information: M. Schubert acknowledges a research fellowship from The Swedish Foundation for International Cooperation in Research and Higher Education, Sweden, and support from Link{\"o}pings universitet/Link{\"o}ping Institute of Technology, Sweden. ; The 3rd International Conference on Spectroscopic Ellipsometry ; Conference date: 06-07-2003 Through 11-07-2003",

year = "2004",

month = may,

day = "1",

doi = "10.1016/j.tsf.2003.11.194",

language = "English (US)",

volume = "455-456",

pages = "295--300",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier B.V.",

}

TY - JOUR

T1 - Infrared ellipsometry characterization of conducting thin organic films

AU - Schubert, M.

AU - Bundesmann, C.

AU - Jakopic, G.

AU - Maresch, H.

AU - Arwin, H.

AU - Persson, N. C.

AU - Zhang, F.

AU - Inganäs, O.

N1 - Funding Information: M. Schubert acknowledges a research fellowship from The Swedish Foundation for International Cooperation in Research and Higher Education, Sweden, and support from Linköpings universitet/Linköping Institute of Technology, Sweden.

PY - 2004/5/1

Y1 - 2004/5/1

N2 - Infrared spectroscopic ellipsometry for wave numbers from 333 to 4000 cm-1 is demonstrated as a useful technique for characterization of structural, vibrational, and free-charge-carrier properties of conducting organic thin layers deposited on electrically conducting as well as on isolating substrates. Pentacene and poly(3,4-ethylenedioxy thiophene)/ poly(styrenesulfonate) (PEDOT:PSS) are studied exemplarily. For both materials, the infrared dielectric functions are reported, which can serve as fingerprints for multiple-layer structures analysis. PEDOT:PSS layers deposited onto n-type and p-type silicon substrates reveal different conductivity response, whereas the IRSE data show that the pentacene layers on glass are rendered highly resistive.

AB - Infrared spectroscopic ellipsometry for wave numbers from 333 to 4000 cm-1 is demonstrated as a useful technique for characterization of structural, vibrational, and free-charge-carrier properties of conducting organic thin layers deposited on electrically conducting as well as on isolating substrates. Pentacene and poly(3,4-ethylenedioxy thiophene)/ poly(styrenesulfonate) (PEDOT:PSS) are studied exemplarily. For both materials, the infrared dielectric functions are reported, which can serve as fingerprints for multiple-layer structures analysis. PEDOT:PSS layers deposited onto n-type and p-type silicon substrates reveal different conductivity response, whereas the IRSE data show that the pentacene layers on glass are rendered highly resistive.

KW - Anisotropy

KW - Conducting polymers

KW - Ellipsometry

KW - Infrared spectroscopic ellipsometry (IRSE)

KW - Pentacene

UR - http://www.scopus.com/inward/record.url?scp=17144467138&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=17144467138&partnerID=8YFLogxK

U2 - 10.1016/j.tsf.2003.11.194

DO - 10.1016/j.tsf.2003.11.194

M3 - Conference article

AN - SCOPUS:17144467138

SN - 0040-6090

VL - 455-456

SP - 295

EP - 300

JO - Thin Solid Films

JF - Thin Solid Films

T2 - The 3rd International Conference on Spectroscopic Ellipsometry

Y2 - 6 July 2003 through 11 July 2003

ER -

Infrared ellipsometry characterization of conducting thin organic films

Abstract

Keywords

ASJC Scopus subject areas

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