Infrared ellipsometry characterization of conducting thin organic films

M. Schubert, C. Bundesmann, G. Jakopic, H. Maresch, H. Arwin, N. C. Persson, F. Zhang, O. Inganäs

Research output: Contribution to journalConference articlepeer-review

18 Scopus citations


Infrared spectroscopic ellipsometry for wave numbers from 333 to 4000 cm-1 is demonstrated as a useful technique for characterization of structural, vibrational, and free-charge-carrier properties of conducting organic thin layers deposited on electrically conducting as well as on isolating substrates. Pentacene and poly(3,4-ethylenedioxy thiophene)/ poly(styrenesulfonate) (PEDOT:PSS) are studied exemplarily. For both materials, the infrared dielectric functions are reported, which can serve as fingerprints for multiple-layer structures analysis. PEDOT:PSS layers deposited onto n-type and p-type silicon substrates reveal different conductivity response, whereas the IRSE data show that the pentacene layers on glass are rendered highly resistive.

Original languageEnglish (US)
Pages (from-to)295-300
Number of pages6
JournalThin Solid Films
StatePublished - May 1 2004
Externally publishedYes
EventThe 3rd International Conference on Spectroscopic Ellipsometry - Vienna, Austria
Duration: Jul 6 2003Jul 11 2003


  • Anisotropy
  • Conducting polymers
  • Ellipsometry
  • Infrared spectroscopic ellipsometry (IRSE)
  • Pentacene

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry


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