Infrared ellipsometry on hexagonal and cubic boron nitride thin films

E. Franke, H. Neumann, M. Schubert, T. E. Tiwald, J. A. Woollam, J. Hahn

Research output: Contribution to journalArticlepeer-review

15 Scopus citations

Fingerprint

Dive into the research topics of 'Infrared ellipsometry on hexagonal and cubic boron nitride thin films'. Together they form a unique fingerprint.

Keyphrases

Material Science